The IMS5400-TH absolute interferometer opens up new perspectives in industrial thickness measurements. The interferometer is used for highly accurate thickness measurements from a relatively large distance. The large thickness measuring range allows the measurement of thin layers, flat glass and films. As the absolute interferometer works with an SLED in the near-infrared range, it is possible to measure the thickness of optically non-dense objects such as anti-reflective coated glass.
| Micro-Epsilon Group | |
|---|---|
| Product Category | Interferometers |
| Product Number | interferoMETER IMS5400-TH |
| Product Name | Stable thickness measurement with submicrometer resolution |
| Measurement Capability | Thickness; Specialty / Other; Thickness |
| Optical Configuration | NIR-SLED interferometer |
| User Interface | Analog Control; Digital |
