Micro-Epsilon Group Stable thickness measurement with submicrometer resolution interferoMETER IMS5400MP-TH

Description
The IMS5400MP-TH absolute interferometer is used for highly accurate thickness measurements from a relatively large distance. A decisive advantage is the distance-independent measurement, where a stable nanometer-accurate thickness value is achieved. With the multi-layer thickness measurement, up to 5 layers can be measured.
  • Stable thickness measurement with submicrometer resolution - interferoMETER IMS5400MP-TH - Micro-Epsilon Group
    Micro-Epsilon Group
Request a Quote Datasheet
Description
The IMS5400MP-TH absolute interferometer is used for highly accurate thickness measurements from a relatively large distance. A decisive advantage is the distance-independent measurement, where a stable nanometer-accurate thickness value is achieved. With the multi-layer thickness measurement, up to 5 layers can be measured.
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Suppliers

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Description
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Stable thickness measurement with submicrometer resolution - interferoMETER IMS5400MP-TH - Micro-Epsilon Group
Micro-Epsilon Group
Ortenburg, Germany
Stable thickness measurement with submicrometer resolution
interferoMETER IMS5400MP-TH
Stable thickness measurement with submicrometer resolution interferoMETER IMS5400MP-TH
The IMS5400MP-TH absolute interferometer is used for highly accurate thickness measurements from a relatively large distance. A decisive advantage is the distance-independent measurement, where a stable nanometer-accurate thickness value is achieved. With the multi-layer thickness measurement, up to 5 layers can be measured.

The IMS5400MP-TH absolute interferometer is used for highly accurate thickness measurements from a relatively large distance. A decisive advantage is the distance-independent measurement, where a stable nanometer-accurate thickness value is achieved. With the multi-layer thickness measurement, up to 5 layers can be measured.

Supplier's Site Datasheet

Technical Specifications

  Micro-Epsilon Group
Product Category Interferometers
Product Number interferoMETER IMS5400MP-TH
Product Name Stable thickness measurement with submicrometer resolution
Measurement Capability Thickness; Specialty / Other; Thickness
Optical Configuration NIR-SLED interferometer
User Interface Analog Control; Digital
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