The Model CPX is a cryogenic probe station designed for non-destructive electrical characterization of materials and devices under variable temperature and magnetic field conditions. It accommodates samples up to 102 mm (4 in) in diameter and supports configurations with up to six probe arms. The system is compatible with liquid helium and liquid nitrogen cooling, and features multiple radiation shields to achieve low-temperature performance. A split-flow design and high vacuum option minimize sample condensation during cool-down. The station includes customizable options for sample transfer under vacuum and is configured with integrated temperature sensors for accurate, repeatable measurements.
With a modular design to meet the needs of a breadth of experiments, the Model CPX is Lake Shore’s most versatile, high-performance cryogenic probe station. Various options and configurations on the CPX enable the researcher to conduct exacting, challenging test measurements. The CPX has multiple radiation shields to provide Lake Shore’s best low-temperature performance with configurations enabling sample temperatures as low as 1.6 K. Multiple temperature sensors throughout the station ensure accurate, repeated measurements.
Due to the split flow design, the sample stays warm while the shields cool, which, along with the high vacuum option, minimizes sample condensation during cool-down—a key requirement for measuring hydrophilic organic materials. Ideal applications include research in organics and microwave measurements. Vacuum load-locks are configurable for conducting high-throughput measurements. In addition, the CPX can be configured to enable controlled sample transport under vacuum to the chamber. The CPX accommodates 51 mm (2 in) diameter wafers (up to 102 mm [4 in] optional). The system operates with either liquid helium or liquid nitrogen.
| Lake Shore Cryotronics, Inc. | |
|---|---|
| Product Category | Nondestructive Testing (NDT) Probes |
| Product Number | Model CPX |
| Product Name | Cryogenic Probe Station |
| NDT Probe Technology | Magnetic / Hall Effect |