ZwickRoell LP Nanoindenter for scanning electron microscopes ZHN/SEM

The ZHN/SEM nano indenter for installation in a scanning electron microscope (SEM) enables micromechanical experiments to be performed while observing the specimen at maximum resolution. It possesses the largest measuring range currently available, with a maximum displacement measurement of 200 µm and a maximum force of 200 mN, combined with very low-noise force and displacement sensors in a low-vibration environment. Instrument stiffness is so high that conventional hardness measurements can be performed without difficulty. The standard system was developed for installation on the stage system of various SEMs, but can also be mounted on the chamber wall. The existing tilt and positioning options of the SEM stage can be used with this system.