The E8254A is a 20 GHz RF Generator from Agilent. An RF generator is a tool engineers use to generate sinusoidal outputs while testing electronic equipment. The output will automatically have its frequency varied or swept between frequencies. A “sweep” is one complete cycle of a frequency variation. Engineers use RF signal generators as test equipment, mostly to measure responses of filters, amplifiers, and electrical components.
Additional Features:
Widest frequency range (250 kHz to 40 GHz) with 0.01 Hz frequency resolution - standard
Highest power available (+9/+14) at 40 GHz with excellent level accuracy (0.7 and 0.9 dB)
SSB phase noise less than -110 dBc/Hz at 20 kHz offset at 10 GHz carrier
Digital Sweep functions (list and step) with capability of calibrating every point at the test port using the user flatness correction
Easy frequency extension to 110 GHz with Agilent's 83550 Series
AM, FM, phase, and pulse modulation
Dual internal modulation generators with sine, square, triangle, positive/negative ramp, Gaussian Noise, Uniform Noise, Swept Sine, Dual Sine up to 1 MHz rates
Internal pulse generator 14 MHz max PRF
Fast pulse from 500 MHz to 3.2 GHz with Option HE6
The Agilent E8254A Performance Signal Generator series offers accurate characterization of products and eliminates the need of an external amplifier for testing high power devices. The E8250 series provides 14 dBm at 40 GHz (option 1EA), reducing overall equipment and test costs. The superior level accuracy of the Agilent E8254A (+/- 0.7 dB) reduces test uncertainties and improves production throughput. Standard products have phase noise performance of -85 dBc/Hz at 1 kHz offset and -110 dBc/Hz at 20 kHz offset and a 10 GHz carrier. The Agilent 8254A provides improved performance with option UNJ of -98 dBc/Hz at 1 kHz offset and -110 dBc/Hz at 10 kHz offset and a 10 GHz carrier. Because the new Agilent E8254A PSG guarantees accurate evaluation of devices, errors can be pinpointed early on in the design process thus resulting in a reduced development time.
The E8254A is a 20 GHz RF Generator from Agilent. An RF generator is a tool engineers use to generate sinusoidal outputs while testing electronic equipment. The output will automatically have its frequency varied or swept between frequencies. A “sweep” is one complete cycle of a frequency variation. Engineers use RF signal generators as test equipment, mostly to measure responses of filters, amplifiers, and electrical components.
Additional Features:
- Widest frequency range (250 kHz to 40 GHz) with 0.01 Hz frequency resolution - standard
- Highest power available (+9/+14) at 40 GHz with excellent level accuracy (0.7 and 0.9 dB)
- SSB phase noise less than -110 dBc/Hz at 20 kHz offset at 10 GHz carrier
- Digital Sweep functions (list and step) with capability of calibrating every point at the test port using the user flatness correction
- Easy frequency extension to 110 GHz with Agilent's 83550 Series
- AM, FM, phase, and pulse modulation
- Dual internal modulation generators with sine, square, triangle, positive/negative ramp, Gaussian Noise, Uniform Noise, Swept Sine, Dual Sine up to 1 MHz rates
- Internal pulse generator 14 MHz max PRF
- Fast pulse from 500 MHz to 3.2 GHz with Option HE6
The Agilent E8254A Performance Signal Generator series offers accurate characterization of products and eliminates the need of an external amplifier for testing high power devices. The E8250 series provides 14 dBm at 40 GHz (option 1EA), reducing overall equipment and test costs. The superior level accuracy of the Agilent E8254A (+/- 0.7 dB) reduces test uncertainties and improves production throughput. Standard products have phase noise performance of -85 dBc/Hz at 1 kHz offset and -110 dBc/Hz at 20 kHz offset and a 10 GHz carrier. The Agilent 8254A provides improved performance with option UNJ of -98 dBc/Hz at 1 kHz offset and -110 dBc/Hz at 10 kHz offset and a 10 GHz carrier. Because the new Agilent E8254A PSG guarantees accurate evaluation of devices, errors can be pinpointed early on in the design process thus resulting in a reduced development time.
