Texas Instruments SN54BCT8374A Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops SNJ54BCT8374AFK

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Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 28-LCCC -55 to 125

Texas Instruments

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Description

Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 28-LCCC -55 to 125

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Texas Instruments

Dallas, TX, United States

SN54BCT8374A Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops
SNJ54BCT8374AFK

SN54BCT8374A Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops SNJ54BCT8374AFK

Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 28-LCCC -55 to 125

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Technical Specifications

	Texas Instruments
Product Category	Flip-Flops
Product Number	SNJ54BCT8374AFK
Product Name	SN54BCT8374A Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops
Operating Temperature	-55 to 125 C (-67 to 257 F)

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