Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 28-LCCC -55 to 125
| Texas Instruments | |
|---|---|
| Product Category | Flip-Flops |
| Product Number | SNJ54BCT8374AFK |
| Product Name | SN54BCT8374A Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops |
| Operating Temperature | -55 to 125 C (-67 to 257 F) |
