Texas Instruments SN54BCT8374A Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops SNJ54BCT8374AFK

Description
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 28-LCCC -55 to 125
  • SN54BCT8374A Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops - SNJ54BCT8374AFK - Texas Instruments
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Description
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 28-LCCC -55 to 125
Request a Quote Datasheet

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SN54BCT8374A Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops - SNJ54BCT8374AFK - Texas Instruments
Texas Instruments
Dallas, TX, United States
SN54BCT8374A Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops
SNJ54BCT8374AFK
SN54BCT8374A Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops SNJ54BCT8374AFK
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 28-LCCC -55 to 125

Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 28-LCCC -55 to 125

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Technical Specifications

  Texas Instruments
Product Category Flip-Flops
Product Number SNJ54BCT8374AFK
Product Name SN54BCT8374A Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops
Operating Temperature -55 to 125 C (-67 to 257 F)
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