Texas Instruments SN54BCT8373A Scan Test Devices With Octal D-type Latches SNJ54BCT8373AFK

Name: SN54BCT8373A Scan Test Devices With Octal D-type Latches
Brand: Texas Instruments

Description

Scan Test Devices With Octal D-type Latches 28-LCCC -55 to 125

Request a Quote

Email Supplier

Datasheet

Description

Scan Test Devices With Octal D-type Latches 28-LCCC -55 to 125

Request a Quote

Email Supplier

Datasheet

Suppliers

Company

Product

Description

Supplier Links

Dallas, TX, United States

SN54BCT8373A Scan Test Devices With Octal D-type Latches
SNJ54BCT8373AFK

SN54BCT8373A Scan Test Devices With Octal D-type Latches SNJ54BCT8373AFK

Scan Test Devices With Octal D-type Latches 28-LCCC -55 to 125

Supplier's Site

Datasheet

Futian, China

Integrated Circuits (ICs) - Logic - Specialty Logic
SNJ54BCT8373AFK

Integrated Circuits (ICs) - Logic - Specialty Logic SNJ54BCT8373AFK

SCAN TEST DEVICES WITH OCTAL D-T

Supplier's Site

	Texas Instruments	Shenzhen Shengyu Electronics Technology Limited
Product Category	IC Interfaces	IC Interfaces
Product Number	SNJ54BCT8373AFK	SNJ54BCT8373AFK
Product Name	SN54BCT8373A Scan Test Devices With Octal D-type Latches	Integrated Circuits (ICs) - Logic - Specialty Logic
Technology	BCT