Texas Instruments SN74BCT8374A Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops SN74BCT8374ADW

Name: SN74BCT8374A Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops
Brand: Texas Instruments

Description

Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops 24-SOIC 0 to 70

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Datasheet

Description

Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops 24-SOIC 0 to 70

Request a Quote

Email Supplier

Datasheet

Suppliers

Company

Product

Description

Supplier Links

Dallas, TX, United States

SN74BCT8374A Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops
SN74BCT8374ADW

SN74BCT8374A Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops SN74BCT8374ADW

Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops 24-SOIC 0 to 70

Supplier's Site

Datasheet

Futian, China

Integrated Circuits (ICs) - Logic - Specialty Logic
SN74BCT8374ADW

Integrated Circuits (ICs) - Logic - Specialty Logic SN74BCT8374ADW

IC SCAN TEST DEVICE W/FF 24-SOIC

Supplier's Site

	Texas Instruments	Shenzhen Shengyu Electronics Technology Limited
Product Category	IC Interfaces	IC Interfaces
Product Number	SN74BCT8374ADW	SN74BCT8374ADW
Product Name	SN74BCT8374A Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops	Integrated Circuits (ICs) - Logic - Specialty Logic
Technology	BCT