Texas Instruments SN74BCT8373A IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches SN74BCT8373ADW

Name: SN74BCT8373A IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches
Brand: Texas Instruments

Description

IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70

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Description

IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70

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Datasheet

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Dallas, TX, United States

SN74BCT8373A IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches
SN74BCT8373ADW

SN74BCT8373A IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches SN74BCT8373ADW

IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70

Supplier's Site

Datasheet

Futian, China

Integrated Circuits (ICs) - Logic - Specialty Logic
SN74BCT8373ADW

Integrated Circuits (ICs) - Logic - Specialty Logic SN74BCT8373ADW

IC SCAN TEST DEVICE LATCH 24SOIC

Supplier's Site

	Texas Instruments	Shenzhen Shengyu Electronics Technology Limited
Product Category	IC Interfaces	IC Interfaces
Product Number	SN74BCT8373ADW	SN74BCT8373ADW
Product Name	SN74BCT8373A IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches	Integrated Circuits (ICs) - Logic - Specialty Logic
Technology	BCT

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