Texas Instruments Logic IC SN74ABT18640DL

Description
Scan Test Device Product overview: SN74ABT18640DL from Texas Instruments is a Logic IC for digital control, signal routing, level logic, timing, buffering, and embedded board design. It is useful for engineers and buyers comparing datasheets, replacement parts, BOM lines, package options, lifecycle status, and procurement availability. Key searchable attributes include key electrical ratings, package details, and application requirements. Search-friendly keywords include logic IC, gate, inverter, buffer, digital signal, Specialty Logic ICs. This listing supports clearer product discovery for industrial, commercial, repair, automation, power, sensing, and embedded system projects. Product number 703-SN74ABT18640DL can be used for catalog matching and distributor lookup.
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Description
Scan Test Device Product overview: SN74ABT18640DL from Texas Instruments is a Logic IC for digital control, signal routing, level logic, timing, buffering, and embedded board design. It is useful for engineers and buyers comparing datasheets, replacement parts, BOM lines, package options, lifecycle status, and procurement availability. Key searchable attributes include key electrical ratings, package details, and application requirements. Search-friendly keywords include logic IC, gate, inverter, buffer, digital signal, Specialty Logic ICs. This listing supports clearer product discovery for industrial, commercial, repair, automation, power, sensing, and embedded system projects. Product number 703-SN74ABT18640DL can be used for catalog matching and distributor lookup.
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Datasheet
Datasheet Summary
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The SN74ABT18640 is an 18-bit inverting bus transceiver integrated circuit designed for scan testing applications. It is part of the Texas Instruments SCOPE family, which supports IEEE Standard 1149.1-1990 for boundary-scan testing, facilitating the testing of complex circuit-board assemblies. The device can operate in normal mode as either two 9-bit transceivers or one 18-bit transceiver, with data flow controlled by direction-control and output-enable inputs. In test mode, the device's normal operation is inhibited, allowing the test circuitry to perform various functions such as parallel-signature analysis and pseudo-random pattern generation. The SN74ABT18640 is available in shrink small-outline (DL) and thin shrink small-outline (DGG) packages, providing a compact solution with a high I/O pin count. It operates within a temperature range of -40¬8C to 85¬8C and requires a supply voltage of 4.5V to 5.5V. This product is suitable for applications requiring robust testing capabilities in a space-efficient package.

Datasheet Summary
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The SN74ABT18640 is an 18-bit inverting bus transceiver integrated circuit designed for scan testing applications. It is part of the Texas Instruments SCOPE family, which supports IEEE Standard 1149.1-1990 for boundary-scan testing, facilitating the testing of complex circuit-board assemblies. The device can operate in normal mode as either two 9-bit transceivers or one 18-bit transceiver, with data flow controlled by direction-control and output-enable inputs. In test mode, the device's normal operation is inhibited, allowing the test circuitry to perform various functions such as parallel-signature analysis and pseudo-random pattern generation. The SN74ABT18640 is available in shrink small-outline (DL) and thin shrink small-outline (DGG) packages, providing a compact solution with a high I/O pin count. It operates within a temperature range of -40¬8C to 85¬8C and requires a supply voltage of 4.5V to 5.5V. This product is suitable for applications requiring robust testing capabilities in a space-efficient package.

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Scan Test Device Product overview: SN74ABT18640DL from Texas Instruments is a Logic IC for digital control, signal routing, level logic, timing, buffering, and embedded board design. It is useful for engineers and buyers comparing datasheets, replacement parts, BOM lines, package options, lifecycle status, and procurement availability. Key searchable attributes include key electrical ratings, package details, and application requirements. Search-friendly keywords include logic IC, gate, inverter, buffer, digital signal, Specialty Logic ICs. This listing supports clearer product discovery for industrial, commercial, repair, automation, power, sensing, and embedded system projects. Product number 703-SN74ABT18640DL can be used for catalog matching and distributor lookup.

Scan Test Device Product overview: SN74ABT18640DL from Texas Instruments is a Logic IC for digital control, signal routing, level logic, timing, buffering, and embedded board design. It is useful for engineers and buyers comparing datasheets, replacement parts, BOM lines, package options, lifecycle status, and procurement availability. Key searchable attributes include key electrical ratings, package details, and application requirements. Search-friendly keywords include logic IC, gate, inverter, buffer, digital signal, Specialty Logic ICs. This listing supports clearer product discovery for industrial, commercial, repair, automation, power, sensing, and embedded system projects. Product number 703-SN74ABT18640DL can be used for catalog matching and distributor lookup.

Supplier's Site Datasheet
Integrated Circuits (ICs) - Logic - Specialty Logic - 1256272-SN74ABT18640DL - Win Source Electronics
Laguna Hills, CA, United States
Integrated Circuits (ICs) - Logic - Specialty Logic
1256272-SN74ABT18640DL
Integrated Circuits (ICs) - Logic - Specialty Logic 1256272-SN74ABT18640DL
Win Source Part Number: 1256272-SN74ABT18640 DL Category: Integrated Circuits (ICs)>Logic - Specialty Logic Series: 74ABT Package: Tube Standard Package: 20 Mounting: SMD (SMT) Logic Type: Scan Test Device with Inverting Bus Transceivers Number of Bits: 18 Supply Voltage: 4.5V ~ 5.5V Package / Case: 56-BSSOP (0.295", 7.50mm Width) Supplier Device Package: 56-SSOP Temperature Range - Operating: -40°C ~ 85°C ECCN: EAR99 Fake Threat In the Open Market: 60 pct. MSL Level: 1 (Unlimited) REACH Status: REACH Unaffected HTSUS: 8542.39.0001 Mfr: Texas Instruments Other Names: 2156-SN74ABT18640DL, 927-SN74ABT18640DL,2 96-3942-5,-SN74ABT18 640DLG4,927-SN74ABT1 8640DL,SN74ABT18640D LG4,-SN74ABT18640DLG 4R,-296-3942-5,TEXTI SSN74ABT18640DL,SN74 ABT18640DLG4,-296-39 42-5,-SN74ABT18640DL R,296-3942-5R,-296-3 942-5R Base Product Number: 74ABT18640

Win Source Part Number: 1256272-SN74ABT18640DL
Category: Integrated Circuits (ICs)>Logic - Specialty Logic
Series: 74ABT
Package: Tube
Standard Package: 20
Mounting: SMD (SMT)
Logic Type: Scan Test Device with Inverting Bus Transceivers
Number of Bits: 18
Supply Voltage: 4.5V ~ 5.5V
Package / Case: 56-BSSOP (0.295", 7.50mm Width)
Supplier Device Package: 56-SSOP
Temperature Range - Operating: -40°C ~ 85°C
ECCN: EAR99
Fake Threat In the Open Market: 60 pct.
MSL Level: 1 (Unlimited)
REACH Status: REACH Unaffected
HTSUS: 8542.39.0001
Mfr: Texas Instruments
Other Names: 2156-SN74ABT18640DL,927-SN74ABT18640DL,296-3942-5,-SN74ABT18640DLG4,927-SN74ABT18640DL,SN74ABT18640DLG4,-SN74ABT18640DLG4R,-296-3942-5,TEXTISSN74ABT18640DL,SN74ABT18640DLG4,-296-3942-5,-SN74ABT18640DLR,296-3942-5R,-296-3942-5R
Base Product Number: 74ABT18640

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Technical Specifications

  ERSAELECTRONICS PTE. LTD. Win Source Electronics
Product Category Logic Gates Logic Gates
Product Number 703-SN74ABT18640DL 1256272-SN74ABT18640DL
Product Name Logic IC Integrated Circuits (ICs) - Logic - Specialty Logic
Gate Type Inverting, Transceiver Scan Test Device with Inverting Bus Transceivers
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