Rochester Electronics Logic - Buffers, Drivers, Receivers, Transceivers SN74ABT8245DW

The SN74ABT8245DW is a scan test device featuring octal bus transceivers, designed to support IEEE Standard 1149.1-1990 boundary scan for testing complex circuit-board assemblies. It operates in normal mode as a bus transceiver, allowing data flow between two buses (A and B) controlled by direction-control (DIR) and output-enable (OE) inputs. The device can isolate the buses when OE is high. In test mode, the device enables test circuitry for boundary-scan operations, allowing for functions such as parallel-signature analysis and pseudo-random pattern generation. The SN74ABT8245DW is characterized for operation within a temperature range of -40¬8C to 85¬8C and is available in a 24-pin SOIC package. This product is suitable for applications requiring robust testing capabilities in digital circuits.