Key features:
Suitable for most major brand microscopes.
1µm or better repeatability
Quiet and reliable
Wide range of sample holders.
Intelligent Scanning Technology (U.S. Patent 7,330,307)
The H107 ProScan stage adapts to virtually any inverted microscope or optical system. It allows you to perform scanning using a very broad range of sample holders, including microtitre plates, slide holders, petri dishes, well plates, flasks, haemocytometers and metallurgical sample holders. This stage offers a unique combination of precision and flexibility. The H107 ProScan stage incorporates the patented - Intelligent Scanning Technology (IST). In conjunction with extensive testing, Intelligent Scanning Technology (IST) allows each stage to be pre-programmed with a unique set of operating characteristics particular to that stage to ensure optimum performance. IST (also available on H101A, H117 and H138A models) allows the ProScan III controller to make any required adjustments to maintain superior orthogonally and metric accuracy.
Key features:
- Suitable for most major brand microscopes.
- 1µm or better repeatability
- Quiet and reliable
- Wide range of sample holders.
- Intelligent Scanning Technology (U.S. Patent 7,330,307)
The H107 ProScan stage adapts to virtually any inverted microscope or optical system. It allows you to perform scanning using a very broad range of sample holders, including microtitre plates, slide holders, petri dishes, well plates, flasks, haemocytometers and metallurgical sample holders. This stage offers a unique combination of precision and flexibility. The H107 ProScan stage incorporates the patented - Intelligent Scanning Technology (IST). In conjunction with extensive testing, Intelligent Scanning Technology (IST) allows each stage to be pre-programmed with a unique set of operating characteristics particular to that stage to ensure optimum performance. IST (also available on H101A, H117 and H138A models) allows the ProScan III controller to make any required adjustments to maintain superior orthogonally and metric accuracy.