The 74HC174-Q100; 74HCT174-Q100 are hex positive edge-triggered D-type flip-flops with individual data inputs (Dn) and outputs (Qn). The common clock (CP) and master reset (MR) inputs load and reset all flip-flops simultaneously. The D-input that meets the set-up and hold time requirements on the LOW-to-HIGH clock transition is stored in the flip-flop and appears at the Q output. A LOW on MR causes the flip-flops and outputs to be reset LOW. Inputs include clamp diodes. This enables the use of current limiting resistors to interface inputs to voltages in excess of VCC.
This product has been qualified to the Automotive Electronics Council (AEC) standard Q100 (Grade 1) and is suitable for use in automotive applications.
Features and benefits Automotive product qualification in accordance with AEC-Q100 (Grade 1) Specified from -40 °C to +85 °C and from -40 °C to +125 °C Wide supply voltage range from 2.0 to 6.0 V CMOS low power dissipation High noise immunity Input levels: For 74HC174-Q100: CMOS level For 74HCT174-Q100: TTL level Six edge-triggered D-type flip-flops Asynchronous master reset Complies with JEDEC standards JESD8C (2.7 V to 3.6 V) JESD7A (2.0 V to 6.0 V) Latch-up performance exceeds 100 mA per JESD 78 Class II Level B ESD protection: MIL-STD-883, method 3015 exceeds 2000 V HBM JESD22-A114F exceeds 2000 V MM JESD22-A115-A exceeds 200 V (C = 200 pF, R = 0 Ω)
The 74HC174-Q100; 74HCT174-Q100 are hex positive edge-triggered D-type flip-flops with individual data inputs (Dn) and outputs (Qn). The common clock (CP) and master reset (MR) inputs load and reset all flip-flops simultaneously. The D-input that meets the set-up and hold time requirements on the LOW-to-HIGH clock transition is stored in the flip-flop and appears at the Q output. A LOW on MR causes the flip-flops and outputs to be reset LOW. Inputs include clamp diodes. This enables the use of current limiting resistors to interface inputs to voltages in excess of VCC.
This product has been qualified to the Automotive Electronics Council (AEC) standard Q100 (Grade 1) and is suitable for use in automotive applications.
Features and benefits
- Automotive product qualification in accordance with AEC-Q100 (Grade 1)
- Specified from -40 °C to +85 °C and from -40 °C to +125 °C
- Wide supply voltage range from 2.0 to 6.0 V
- CMOS low power dissipation
- High noise immunity
- Input levels:
- For 74HC174-Q100: CMOS level
- For 74HCT174-Q100: TTL level
- Six edge-triggered D-type flip-flops
- Asynchronous master reset
- Complies with JEDEC standards
- JESD8C (2.7 V to 3.6 V)
- JESD7A (2.0 V to 6.0 V)
- Latch-up performance exceeds 100 mA per JESD 78 Class II Level B
- ESD protection:
- MIL-STD-883, method 3015 exceeds 2000 V
- HBM JESD22-A114F exceeds 2000 V
- MM JESD22-A115-A exceeds 200 V (C = 200 pF, R = 0 Ω)
