The JEM-ACE200F is an electron microscope responding to the system allowing for an operator to obtain data without operating the electron microscope by creating recipes for operation workflow.
Since the JEM-ACE200F inherits hardware technologies of the JEM-ARM200F high-end TEM and the JEM-F200 multi-purpose FE-TEM, this new high throughput analytical electron microscope provides superbly high stability and analytical capabilities with a renewed sophisticated exterior design.
| JEOL USA, Inc. | |
|---|---|
| Product Category | Microscopes |
| Product Number | JEM-ACE200F |
| Product Name | JEM-ACE200F High Throughput Analytical Electron Microscope |
| Microscope Type | Transmission Electron Microscope |
