These in-situ miniature bend, fatigue, strain, and tensile testers are designed for use in Scanning Electron Microscopes (SEMs), and Light Microscopes (LMs). The dual leadscrew design symmetrically loads samples while keeping them centered within the scopes field of view. 100, 1000 and 2000 pound versions are standard with a wide range of sample clamps, bending fixtures (3 and 4 point) and compression anvils. Custom mounting adapters are available for integration into virtually all major microscopy tools. Optional heaters also offered for testing under high temperature conditions. Features Compact, computer controlled load frame fits inside microscope chamber Lightweight aluminum alloy construction Internal motor drive Computer controlled Quick connect mounting fixtures adaptable to most microscopes are available for seamless integration into most major microscopy tools Non-magnetic, vacuum-compatible components Ball bearing design Pico meter resolution on position control Widely understood materials testing software Quick, easy installation No microscope alterations required Optional heaters are available for testing