Measure film thickness in-line and in real-time at up to seven locations with the F37.
Example Layers
Almost any smooth and at-least-partially transparent films may be measured. This includes virtually any semiconducting material, including those used in thin-film photovoltaics.
Example Layers
MBE and MOCVD: Smooth and translucent, or lightly absorbing films, may be measured. This includes virtually any semiconducting material, from AIGaN to GaInAsP.
Benefits:
Dramatically improves productivity
Low cost-Can pay for itself in months
Accurate-Measure to better than ±1%
Fast-Measurements in seconds
Non-Invasive-Totally outside of deposition chamber
Easy to use-Intuitive Windows™ software
Turn-key system sets up in minutes
Measure film thickness in-line and in real-time at up to seven locations with the F37.
Example Layers
Almost any smooth and at-least-partially transparent films may be measured. This includes virtually any semiconducting material, including those used in thin-film photovoltaics.
Example Layers
MBE and MOCVD: Smooth and translucent, or lightly absorbing films, may be measured. This includes virtually any semiconducting material, from AIGaN to GaInAsP.
Benefits:
- Dramatically improves productivity
- Low cost-Can pay for itself in months
- Accurate-Measure to better than ±1%
- Fast-Measurements in seconds
- Non-Invasive-Totally outside of deposition chamber
- Easy to use-Intuitive Windows™ software
- Turn-key system sets up in minutes
