DataPhysics Instruments USA Corp. Optical Contact Angle Goniometers and Drop Shape Analysis System OCA 50 & OCA 50EC

Description
The OCA 50 is the fully automatic measuring device for the time-saving analysis of the wettability of solid surfaces and the determination of the surface energy of solids. The sample table of the OCA 50 can be positioned along all three directions in space via electronic high-performance axes, with both extraordinary speed and highest precision. Combined with an electronic multiple direct dosing system DDE/x and up to four electronic syringe modules ESr-N the determination of surface parameters can be automated completely. The automation of measurements succeeds easier than ever before thanks to the intuitive automation dialogue of the OCA software and its visual drop positioning system. Hence it is possible to determine, for example, the surface energy with four test liquids at different position of even large samples without any manual user intervention. This facilitates a complete and automated sample mapping. In order to map silicon wafers, electronic turn tables with vacuum fixation are available. They allow to access any position for contact angle measurements, even on 12″ wafers. In any case, the 6.5-fold zoom lens and the high-performance camera with USB 3 interface ensure optimal images of the deposited drops. For a fast and intuitive device control, even during complex measurements, the TP 50 control panel with touch screen and precision control wheel is included with every OCA 50.
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Optical Contact Angle Goniometers and Drop Shape Analysis System - OCA 50 & OCA 50EC - DataPhysics Instruments USA Corp.
Charlotte, NC, United States
Optical Contact Angle Goniometers and Drop Shape Analysis System
OCA 50 & OCA 50EC
Optical Contact Angle Goniometers and Drop Shape Analysis System OCA 50 & OCA 50EC
The OCA 50 is the fully automatic measuring device for the time-saving analysis of the wettability of solid surfaces and the determination of the surface energy of solids. The sample table of the OCA 50 can be positioned along all three directions in space via electronic high-performance axes, with both extraordinary speed and highest precision. Combined with an electronic multiple direct dosing system DDE/x and up to four electronic syringe modules ESr-N the determination of surface parameters can be automated completely. The automation of measurements succeeds easier than ever before thanks to the intuitive automation dialogue of the OCA software and its visual drop positioning system. Hence it is possible to determine, for example, the surface energy with four test liquids at different position of even large samples without any manual user intervention. This facilitates a complete and automated sample mapping. In order to map silicon wafers, electronic turn tables with vacuum fixation are available. They allow to access any position for contact angle measurements, even on 12″ wafers. In any case, the 6.5-fold zoom lens and the high-performance camera with USB 3 interface ensure optimal images of the deposited drops. For a fast and intuitive device control, even during complex measurements, the TP 50 control panel with touch screen and precision control wheel is included with every OCA 50.

The OCA 50 is the fully automatic measuring device for the time-saving analysis of the wettability of solid surfaces and the determination of the surface energy of solids. The sample table of the OCA 50 can be positioned along all three directions in space via electronic high-performance axes, with both extraordinary speed and highest precision. Combined with an electronic multiple direct dosing system DDE/x and up to four electronic syringe modules ESr-N the determination of surface parameters can be automated completely. The automation of measurements succeeds easier than ever before thanks to the intuitive automation dialogue of the OCA software and its visual drop positioning system. Hence it is possible to determine, for example, the surface energy with four test liquids at different position of even large samples without any manual user intervention. This facilitates a complete and automated sample mapping. In order to map silicon wafers, electronic turn tables with vacuum fixation are available. They allow to access any position for contact angle measurements, even on 12″ wafers. In any case, the 6.5-fold zoom lens and the high-performance camera with USB 3 interface ensure optimal images of the deposited drops. For a fast and intuitive device control, even during complex measurements, the TP 50 control panel with touch screen and precision control wheel is included with every OCA 50.

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Technical Specifications

  DataPhysics Instruments USA Corp.
Product Category Property Testing Equipment
Product Number OCA 50 & OCA 50EC
Product Name Optical Contact Angle Goniometers and Drop Shape Analysis System
Properties Analyzed Wettability / Contact Angle
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