StellarNet, Inc. Thin-Film Measuring Systems TF Series

TF Systems for Non-Contact Film Thickness Measurements We offer a complete line of film thickness measurement systems that can measure from 5 nm to 200 µm for analysis of single layer and/or multilayer films in less than a second. StellarNet thin film reflectometry systems consist of a portable USB spectrometer coupled to a reflectance probe and light source. The optical properties are obtained from reflection and thickness is measured by detecting the sinusoidal fringe pattern from the sample's specular reflectance. Several spectrometer models are available to suit your thin film and/or optical measurement requirements. Thin Film Applications Solar PV Increased production of Thin-Film Photovoltaics (TFPVs) is becoming more predominant due to lower costs than their silicon-wafer-based cousins. Getting accurate thickness measurement is extremely crucial to efficiency and reliability as well as maintaining production costs. Films include active layers such as thin silicon, II-IV materials such as CdTe, and CIGS (copper indium gallium selenide). Additionally, TCO (transparent conductive oxide) stacks, polyimides and resists used to define cells and electrodes, as well as anti-reflection coatings can all be measures with StellarNet Thin Film Measurement systems. Semiconductors StellarNet systems can measure thickness of non-metallic semiconductor process films. Also, StellarNet Thin Film Measurement systems can be used to locate and identify the cause of failure in integrated circuits. Systems are also used during MEMS patterning processes to measure photoresist thickness and uniformity. These systems are also being used during silicon etching to measure etch rate and membrane thickness and uniformity. Thickness measurement of thick polysilicon films and SOI are also common applications. Polymer Films Polymer films such as PET and polycarbonate require monitoring of film thickness during manufacturing. Please contract ThinFilm_Experts@Ste llarNet.us to discuss your application Displays Most flat panel displays including LCD, OLED, and many other display technologies employ transparent conductive oxides (TCOs) to transport current and to each light emitting element of the display. StellarNet Thin-Film Measurement Systems can be used to measure thickness of Liquid Crystal layers such as polyamide, hardcoat, and air gap. And for OLED displays systems are able to measure layers such as emissive, injection, buffer, and the encapsulation layer. Optics Optical coatings are used to enhance the reflectance and transmittance properties of a substrate material. StellarNet Thin-Film Measurement systems can be used to measure anti-reflection, increased reflection coatings, high-pass, low-pass, and band pass filters. StellarNet spectrometer systems also come with SpectraWiz Software for CIELAB colorimetry. See our colorimeter page. Ophthalmic Lens Coatings StellarNet Thin-Film Measurement Systems can be used to measure coatings on Ophthalmic Lenses. Spectral reflectance can be used to measure anti-reflectance coatings on lenses as well as hardcoat and hydrophobic layer thickness. Metal Films StellarNet Thin-Film Measurement systems have been used to measure the thin metal films in various applications. Please contact ThinFilm_Experts@Ste llarNet.us to discuss your application. Parylene Coatings Parylene and a variety of poly (p-xylylene) polymers are used extensively as moisture barriers and electrical insulators and their coating thicknesses can be measured via reflectance spectroscopy. Parylene applications included coatings for printed circuit boards and medical devices such as stents and pacemakers, permanently implanted in the body. Hardcoat Measurements Many industries use hardcoats and various protective coatings. Layer thickness and thickness monitoring is extremely important for manufacturing and quality control. Thick Resists Thick photoresists such as SU-8, a commonly used epoxy based negative photoresist normally spun in layers from 0.1um to 2mm. Monitoring of thickness can be crucial during production and fabrication of multilayer stacks.