The 4271B is a 1 MHz LCR Meter from Agilent. An LCR meter is a piece of electronic test equipment that measures inductance (L), capacitance (C), and resistance (R) of electronic components. The LCR meter accurately measures these elements on an electronic device, usually one subjected to an alternating current (AC) voltage source. The LCR meter measures the current through and voltage across the device under test.
Additional Features:
Dual 4.5 Digit LED Display
1 MHz Test Frequency
100 ms to 250 ms Measuring Speed for C-G and L-R Measurement
160 ms to 400 ms Measuring Speed for C-D and L-D Measurements
The Agilent 4271B Digital LCR Meter meets the requirements of the lab, manufacturing, and where automatic high speed and accuracy measurements are essential. The four-pair measurement technique has the advantage of reducing error due to residual inductance, stray capacitance, and electromagnetic coupling of leads. Offset adjustments are provided to cancel the residuals of the test fixtures. Typical applications include microcircuit measurements, C-V characteristics of semiconductor devices and passive component tests.
The 4271B is a 1 MHz LCR Meter from Agilent. An LCR meter is a piece of electronic test equipment that measures inductance (L), capacitance (C), and resistance (R) of electronic components. The LCR meter accurately measures these elements on an electronic device, usually one subjected to an alternating current (AC) voltage source. The LCR meter measures the current through and voltage across the device under test.
Additional Features:
- Dual 4.5 Digit LED Display
- 1 MHz Test Frequency
- 100 ms to 250 ms Measuring Speed for C-G and L-R Measurement
- 160 ms to 400 ms Measuring Speed for C-D and L-D Measurements
The Agilent 4271B Digital LCR Meter meets the requirements of the lab, manufacturing, and where automatic high speed and accuracy measurements are essential. The four-pair measurement technique has the advantage of reducing error due to residual inductance, stray capacitance, and electromagnetic coupling of leads. Offset adjustments are provided to cancel the residuals of the test fixtures. Typical applications include microcircuit measurements, C-V characteristics of semiconductor devices and passive component tests.
