Conforming to EN/IEC61000-4-4
Easy handling - Flexible maneuverability. Selection of local control or external PC control. Full functionality under both local and remote control.
Compact, Full Capability, Autonomous Instrument. Output unit and internal CDN in compact body. Widely adjustable parameters. Pulse data can be adjusted during the test run.
Time-saving. IEC standard specified test parameters preprogrammed for instant use. Ramping for voltage and other parameters and sequencing.
Additional output mode. Random frequency, single and continuous pulse modes
Computer control for the highest requirement
Applicable to all electronics sectors
The most basic of basics in EMC test strategies: only an extensive test program from development, qualification to field test can ensure that your products are immune from Electrical Fast Transient/Burst (EFT/B). This is especially true since EFT/B events exist everywhere. In fact, in the scheme of international compliance, the Electrical Fast Transient/Burst immunity test is a must for almost all products. The EFT/B, such as switching transients originating from inductive load interruption, relay contact bounce, etc, are one of the main causes of equipment malfunctions, because they can occur anywhere, interfering with circuits primarily via mains and interconnection cables. EFT is characterized by fast rise times and short duration of pulses. Also significant is the fact that EFT comes in bursts with repetition rates exceeding 100kHz. In the real world, an EFT event is a series of pulses with changing amplitudes and repetition rates. For test purpose, the IEC61000-4-4 standard defines an idealized FET/B. The FNS-2002, with its valuable features and capabilities, will serve as a critical tool for anyone who wants to build quality products or needs to the IEC standard.
- Conforming to EN/IEC61000-4-4
- Easy handling - Flexible maneuverability. Selection of local control or external PC control. Full functionality under both local and remote control.
- Compact, Full Capability, Autonomous Instrument. Output unit and internal CDN in compact body. Widely adjustable parameters. Pulse data can be adjusted during the test run.
- Time-saving. IEC standard specified test parameters preprogrammed for instant use. Ramping for voltage and other parameters and sequencing.
- Additional output mode. Random frequency, single and continuous pulse modes
- Computer control for the highest requirement
- Applicable to all electronics sectors
The most basic of basics in EMC test strategies: only an extensive test program from development, qualification to field test can ensure that your products are immune from Electrical Fast Transient/Burst (EFT/B). This is especially true since EFT/B events exist everywhere. In fact, in the scheme of international compliance, the Electrical Fast Transient/Burst immunity test is a must for almost all products. The EFT/B, such as switching transients originating from inductive load interruption, relay contact bounce, etc, are one of the main causes of equipment malfunctions, because they can occur anywhere, interfering with circuits primarily via mains and interconnection cables. EFT is characterized by fast rise times and short duration of pulses. Also significant is the fact that EFT comes in bursts with repetition rates exceeding 100kHz. In the real world, an EFT event is a series of pulses with changing amplitudes and repetition rates. For test purpose, the IEC61000-4-4 standard defines an idealized FET/B. The FNS-2002, with its valuable features and capabilities, will serve as a critical tool for anyone who wants to build quality products or needs to the IEC standard.
