3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers 64-LQFP -40 to 85
Boundary Scan Reg Bus Transceiver, LVT Series, 2-Func, 9-Bit, True Output, BICMOS, PQFP64
IC SCAN-TEST-DEV/XCVR 64-LQFP
| Texas Instruments | Rochester Electronics | Shenzhen Shengyu Electronics Technology Limited | |
|---|---|---|---|
| Product Category | IC Interfaces | IC Interfaces | IC Interfaces |
| Product Number | SN74LVTH18646APMG4 | SN74LVTH18646APMG4 | SN74LVTH18646APMG4 |
| Product Name | SN74LVTH18646A 3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers | Integrated Circuits (ICs) - Logic - Specialty Logic | |
| Technology | LVT | ||
| Device Type | Transceiver | Transceiver | |
| Features | RoHS | RoHS |