Texas Instruments SN74BCT8373A IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches SN74BCT8373ANT

Name: SN74BCT8373A IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches
Brand: Texas Instruments

Description

IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-PDIP 0 to 70

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Description

IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-PDIP 0 to 70

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Datasheet

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Description

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Dallas, TX, United States

SN74BCT8373A IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches
SN74BCT8373ANT

SN74BCT8373A IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches SN74BCT8373ANT

IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-PDIP 0 to 70

Supplier's Site

Datasheet

Newburyport, MA, United States

SN74BCT8373ANT

Boundary Scan Bus Driver, BCT/FBT Series, 1-Func, 8-Bit, True Output, BICMOS, PDIP24

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Datasheet

Futian, China

Integrated Circuits (ICs) - Logic - Specialty Logic
SN74BCT8373ANT

Integrated Circuits (ICs) - Logic - Specialty Logic SN74BCT8373ANT

IC SCAN TEST DEVICE LATCH 24-DIP

Supplier's Site

	Texas Instruments	Rochester Electronics	Shenzhen Shengyu Electronics Technology Limited
Product Category	IC Interfaces	IC Interfaces	IC Interfaces
Product Number	SN74BCT8373ANT	SN74BCT8373ANT	SN74BCT8373ANT
Product Name	SN74BCT8373A IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches		Integrated Circuits (ICs) - Logic - Specialty Logic
Technology	BCT
Features	RoHS	RoHS
Supply Voltage	Other; 5