IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-PDIP 0 to 70
Boundary Scan Bus Driver, BCT/FBT Series, 1-Func, 8-Bit, True Output, BICMOS, PDIP24
IC SCAN TEST DEVICE LATCH 24-DIP
| Texas Instruments | Rochester Electronics | Shenzhen Shengyu Electronics Technology Limited | |
|---|---|---|---|
| Product Category | IC Interfaces | IC Interfaces | IC Interfaces |
| Product Number | SN74BCT8373ANT | SN74BCT8373ANT | SN74BCT8373ANT |
| Product Name | SN74BCT8373A IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches | Integrated Circuits (ICs) - Logic - Specialty Logic | |
| Technology | BCT | ||
| Features | RoHS | RoHS | |
| Supply Voltage | Other; 5 |
