Texas Instruments SN74BCT8244A IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers SN74BCT8244ANT

Description
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-PDIP 0 to 70
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Description
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-PDIP 0 to 70
Request a Quote Datasheet

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SN74BCT8244A IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers - SN74BCT8244ANT - Texas Instruments
Dallas, TX, United States
SN74BCT8244A IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers
SN74BCT8244ANT
SN74BCT8244A IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers SN74BCT8244ANT
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-PDIP 0 to 70

IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers 24-PDIP 0 to 70

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Technical Specifications

  Texas Instruments
Product Category Logic Gates
Product Number SN74BCT8244ANT
Product Name SN74BCT8244A IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers
Gate Type Buffer/Driver
Supply Voltage 5V; 5
Propagation Delay 8.5 ns
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