Scan Test Devices With 18-Bit Transceivers And Registers 64-LQFP -40 to 85
IC SCAN-TEST-DEV/TXRX 64-LQFP
| Texas Instruments | Shenzhen Shengyu Electronics Technology Limited | |
|---|---|---|
| Product Category | IC Interfaces | IC Interfaces |
| Product Number | SN74ABTH18652APM | SN74ABTH18652APM |
| Product Name | SN74ABTH18652A Scan Test Devices With 18-Bit Transceivers And Registers | Integrated Circuits (ICs) - Logic - Specialty Logic |
| Technology | ABT | |
| Device Type | Transceiver | |
| Features | RoHS |
