Z-Trak laser profiler series delivers high resolution height measurements using laser triangulation techniques. These ergonomically designed, compact units feature powerful FIR-peak detector and are factory calibrated for rapid field deployment with minimal effort.
With its wide selection of models, Z-Trak covers measurement ranges from 10 mm to 1000 mm. Z-Trak delivers highly linear, repeatable results by combining reflectance based dynamic laser power control and optimized optical path.
With sophisticated algorithms and a selection of blue lasers for highly reflected surfaces, or red lasers for complex surfaces made up of both high and low reflectance, Z-Trak capably handles virtually any inspection situation. High quality lasers and a Scheimpflug optimized optical path enables Z-Trak to produce consistent measurement across the entire field of view.
All this and support for GigE Vision standard allows Z-Trak series to work with both the Teledyne DALSA software packages as well as off-the-shelf 3rd party 3D image processing packages. Z-Trak series comes bundled with Sapera LT SDK, Sapera Processing 8.0 Group 1 run-time license or Sherlock 8.0 3D at no additional cost.
Key Markets & Applications
Industrial:
Inline metrology
Volume metric measurements
Robot guidance
Gap and flush
Surface inspection
Electronics:
Chip lead inspection
BGA and micro BGA
Solder paste inspection
Bare PCB
Populated PCB
Machine Vision:
Parts inspection
Embossed OCR
Embossed barcode
Bead inspection
Pick and place
Wood and lumber inspection
Angular measurements
Part identification
Z-Trak laser profiler series delivers high resolution height measurements using laser triangulation techniques. These ergonomically designed, compact units feature powerful FIR-peak detector and are factory calibrated for rapid field deployment with minimal effort.
With its wide selection of models, Z-Trak covers measurement ranges from 10 mm to 1000 mm. Z-Trak delivers highly linear, repeatable results by combining reflectance based dynamic laser power control and optimized optical path.
With sophisticated algorithms and a selection of blue lasers for highly reflected surfaces, or red lasers for complex surfaces made up of both high and low reflectance, Z-Trak capably handles virtually any inspection situation. High quality lasers and a Scheimpflug optimized optical path enables Z-Trak to produce consistent measurement across the entire field of view.
All this and support for GigE Vision standard allows Z-Trak series to work with both the Teledyne DALSA software packages as well as off-the-shelf 3rd party 3D image processing packages. Z-Trak series comes bundled with Sapera LT SDK, Sapera Processing 8.0 Group 1 run-time license or Sherlock 8.0 3D at no additional cost.
Key Markets & Applications
Industrial:
- Inline metrology
- Volume metric measurements
- Robot guidance
- Gap and flush
- Surface inspection
Electronics:
- Chip lead inspection
- BGA and micro BGA
- Solder paste inspection
- Bare PCB
- Populated PCB
Machine Vision:
- Parts inspection
- Embossed OCR
- Embossed barcode
- Bead inspection
- Pick and place
- Wood and lumber inspection
- Angular measurements
- Part identification
