StellarNet, Inc. Thin Film Measurement System TF-VIS

Reliably measure a variety of samples with thicknesses from a few mm to a few inches. Characterize tint/color (with CIELab values), transmission profiles, and more for research, QA/QC applications, and industrial process monitoring. StellarNet’s Optical Metrology measurement system consists of a spectrometer, illumination source, and several sampling accessory options to fit just about anyone’s application requirements. Each spectrometer included in the system is USB-2 powered, shock-proof and vibration tolerant with no moving parts, equipped with the powerful SpectraWiz® spectrometer software and development kit, and is available at an extremely low price! Couple this with StellarNet’s Thin Film Measurement System and have full functionality for measuring thickness and index of both single-layer and multilayer films!