Manual Prober for contacting of active devices on both sides of the wafer. Precision controls enable the user to probe from the top side of the wafer, the bottom side of the wafer, or to simultaneously probe the top and bottom sides of the wafer.
| SemiProbe | |
|---|---|
| Product Category | Wafer and Thin Film Instrumentation |
| Product Number | Simultaneous Double-Sided Prober (DSP) |
| Product Name | Specialty Probe System |
| Form Factor | ProbingSystem |
| Mounting / Loading | Manual loading |
| Technology | Optical / Imaging |
