SemiProbe Lab Assistant Probe System LA-150 DC

Description
The SemiProbe Lab Assistant family of probe systems is specifically designed to address the requirements of Universities and research personnel - simplicity and ease of operation, portability, affordability and modularity. The Lab Assistant provides features and options for both DC and HF/Microwave testing that are typically only available in much more expensive systems multiple stages, chucks, optics and manipulators. Numerous accessories can be added at a later date to enhance the system functionality.
Description
The SemiProbe Lab Assistant family of probe systems is specifically designed to address the requirements of Universities and research personnel - simplicity and ease of operation, portability, affordability and modularity. The Lab Assistant provides features and options for both DC and HF/Microwave testing that are typically only available in much more expensive systems multiple stages, chucks, optics and manipulators. Numerous accessories can be added at a later date to enhance the system functionality.

Suppliers

Company
Product
Description
Supplier Links
Lab Assistant Probe System - LA-150 DC - SemiProbe
Winooski, VT, USA
Lab Assistant Probe System
LA-150 DC
Lab Assistant Probe System LA-150 DC
The SemiProbe Lab Assistant family of probe systems is specifically designed to address the requirements of Universities and research personnel - simplicity and ease of operation, portability, affordability and modularity. The Lab Assistant provides features and options for both DC and HF/Microwave testing that are typically only available in much more expensive systems multiple stages, chucks, optics and manipulators. Numerous accessories can be added at a later date to enhance the system functionality.

The SemiProbe Lab Assistant family of probe systems is specifically designed to address the requirements of Universities and research personnel - simplicity and ease of operation, portability, affordability and modularity. The Lab Assistant provides features and options for both DC and HF/Microwave testing that are typically only available in much more expensive systems multiple stages, chucks, optics and manipulators. Numerous accessories can be added at a later date to enhance the system functionality.

Supplier's Site

Technical Specifications

  SemiProbe
Product Category Wafer and Thin Film Instrumentation
Product Number LA-150 DC
Product Name Lab Assistant Probe System
Form Factor ProbingSystem
Mounting / Loading Manual loading
Technology Optical / Imaging
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