pSemi GaN Power Transistor Test/Evaluation Product EK29101-01

Description
The PE29101 integrated high-speed driver is designed to control the gates of external power devices, such as enhancement mode gallium nitride (GaN) FETs. The outputs of the PE29101 are capable of providing switching transition speeds in the sub-nanosecond range for switching applications up to 40 MHz. High switching speeds result in smaller peripheral components and enable new applications such as wireless power charging. Features High- and Low-side FET drivers Dead-time control Fast propagation delay, 11ns Internal gate overvoltage management Sub-nanosecond rise and fall time 2A/4A peak source/sink current Package – Flip chip Applications DC–DC conversions AC–DC conversions Wireless power LiDAR
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Description
The PE29101 integrated high-speed driver is designed to control the gates of external power devices, such as enhancement mode gallium nitride (GaN) FETs. The outputs of the PE29101 are capable of providing switching transition speeds in the sub-nanosecond range for switching applications up to 40 MHz. High switching speeds result in smaller peripheral components and enable new applications such as wireless power charging. Features High- and Low-side FET drivers Dead-time control Fast propagation delay, 11ns Internal gate overvoltage management Sub-nanosecond rise and fall time 2A/4A peak source/sink current Package – Flip chip Applications DC–DC conversions AC–DC conversions Wireless power LiDAR
Request a Quote Datasheet

Suppliers

Company
Product
Description
Supplier Links
GaN Power Transistor Test/Evaluation Product - EK29101-01 - Richardson RFPD
Downers Grove, IL, United States
GaN Power Transistor Test/Evaluation Product
EK29101-01
GaN Power Transistor Test/Evaluation Product EK29101-01
The PE29101 integrated high-speed driver is designed to control the gates of external power devices, such as enhancement mode gallium nitride (GaN) FETs. The outputs of the PE29101 are capable of providing switching transition speeds in the sub-nanosecond range for switching applications up to 40 MHz. High switching speeds result in smaller peripheral components and enable new applications such as wireless power charging. Features High- and Low-side FET drivers Dead-time control Fast propagation delay, 11ns Internal gate overvoltage management Sub-nanosecond rise and fall time 2A/4A peak source/sink current Package – Flip chip Applications DC–DC conversions AC–DC conversions Wireless power LiDAR

The PE29101 integrated high-speed driver is designed to control the gates of external power devices, such as enhancement mode gallium nitride (GaN) FETs. The outputs of the PE29101 are capable of providing switching transition speeds in the sub-nanosecond range for switching applications up to 40 MHz. High switching speeds result in smaller peripheral components and enable new applications such as wireless power charging.

Features

  • High- and Low-side FET drivers
  • Dead-time control
  • Fast propagation delay, 11ns
  • Internal gate overvoltage management
  • Sub-nanosecond rise and fall time
  • 2A/4A peak source/sink current
  • Package – Flip chip

Applications

  • DC–DC conversions
  • AC–DC conversions
  • Wireless power
  • LiDAR
Supplier's Site Datasheet

Technical Specifications

  Richardson RFPD
Product Category Electronic Development Boards
Product Number EK29101-01
Product Name GaN Power Transistor Test/Evaluation Product
Category Developement Board
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