Polytec, Inc. Optical Surface Profilometry TMS-100

Description
Polytec's TopMap Metro.Lab is an affordable, high-precision, non-contact topography measurement system designed to characterize flat and curved surfaces. Incorporating a scanning white light interferometer, the Metro.Lab can measure flatness and general topography with 20 nanometer resolution and determine parallelity of two or more surfaces separated by as much as 70 mm.
  • Optical Surface Profilometry - TMS-100 - Polytec, Inc.
    Polytec, Inc.
Description
Polytec's TopMap Metro.Lab is an affordable, high-precision, non-contact topography measurement system designed to characterize flat and curved surfaces. Incorporating a scanning white light interferometer, the Metro.Lab can measure flatness and general topography with 20 nanometer resolution and determine parallelity of two or more surfaces separated by as much as 70 mm.

Suppliers

Company
Product
Description
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Optical Surface Profilometry - TMS-100 - Polytec, Inc.
Polytec, Inc.
Irvine, CA, USA
Optical Surface Profilometry
TMS-100
Optical Surface Profilometry TMS-100
Polytec's TopMap Metro.Lab is an affordable, high-precision, non-contact topography measurement system designed to characterize flat and curved surfaces. Incorporating a scanning white light interferometer, the Metro.Lab can measure flatness and general topography with 20 nanometer resolution and determine parallelity of two or more surfaces separated by as much as 70 mm.

Polytec's TopMap Metro.Lab is an affordable, high-precision, non-contact topography measurement system designed to characterize flat and curved surfaces. Incorporating a scanning white light interferometer, the Metro.Lab can measure flatness and general topography with 20 nanometer resolution and determine parallelity of two or more surfaces separated by as much as 70 mm.

Supplier's Site

Technical Specifications

  Polytec, Inc.
Product Category Surface Metrology Equipment
Product Number TMS-100
Product Name Optical Surface Profilometry
Measurement Capability Area or three dimensional profile; Flatness; Parallelism; Roundness
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