Piezosystem Jena, Inc. Laser-interferometric Gauging Probe LM-Series

Description
Our LM-Series laser-interferometri c gauging probes are precision length measurement instruments, the first of their kind to be capable of making contacting length measurements over ranges of 0-20 mm to 0-50 mm with nanometer precision. Their compactly designed gauging heads and 8h6-mm diameter probe shafts allow their use with conventional length measurement systems. Their integral miniature interferometer converts displacements of their motor-driven probe shaft into optical interference signals that are transmitted on a fiber optic cable to their optoelectronic signal processing/power supply unit for processing and output as lengths. Their frequency stabilized He-Ne Laser, which serves as the light source for their miniature interferometer, and their correction of laser wavelengths to compensate for environmental influences form the basis for their high metric precision. Instrument operation and display of measurement results may be via either a separate keypad/display unit or a PC running the software package supplied.
Datasheet
Description
Our LM-Series laser-interferometri c gauging probes are precision length measurement instruments, the first of their kind to be capable of making contacting length measurements over ranges of 0-20 mm to 0-50 mm with nanometer precision. Their compactly designed gauging heads and 8h6-mm diameter probe shafts allow their use with conventional length measurement systems. Their integral miniature interferometer converts displacements of their motor-driven probe shaft into optical interference signals that are transmitted on a fiber optic cable to their optoelectronic signal processing/power supply unit for processing and output as lengths. Their frequency stabilized He-Ne Laser, which serves as the light source for their miniature interferometer, and their correction of laser wavelengths to compensate for environmental influences form the basis for their high metric precision. Instrument operation and display of measurement results may be via either a separate keypad/display unit or a PC running the software package supplied.
Datasheet

Suppliers

Company
Product
Description
Supplier Links
Laser-interferometric Gauging Probe - LM-Series - Piezosystem Jena, Inc.
Hopedale, MA, USA
Laser-interferometric Gauging Probe
LM-Series
Laser-interferometric Gauging Probe LM-Series
Our LM-Series laser-interferometri c gauging probes are precision length measurement instruments, the first of their kind to be capable of making contacting length measurements over ranges of 0-20 mm to 0-50 mm with nanometer precision. Their compactly designed gauging heads and 8h6-mm diameter probe shafts allow their use with conventional length measurement systems. Their integral miniature interferometer converts displacements of their motor-driven probe shaft into optical interference signals that are transmitted on a fiber optic cable to their optoelectronic signal processing/power supply unit for processing and output as lengths. Their frequency stabilized He-Ne Laser, which serves as the light source for their miniature interferometer, and their correction of laser wavelengths to compensate for environmental influences form the basis for their high metric precision. Instrument operation and display of measurement results may be via either a separate keypad/display unit or a PC running the software package supplied.

Our LM-Series laser-interferometric gauging probes are precision length measurement instruments, the first of their kind to be capable of making contacting length measurements over ranges of 0-20 mm to 0-50 mm with nanometer precision. Their compactly designed gauging heads and 8h6-mm diameter probe shafts allow their use with conventional length measurement systems.
Their integral miniature interferometer converts displacements of their motor-driven probe shaft into optical interference signals that are transmitted on a fiber optic cable to their optoelectronic signal processing/power supply unit for processing and output as lengths.
Their frequency stabilized He-Ne Laser, which serves as the light source for their miniature interferometer, and their correction of laser wavelengths to compensate for environmental influences form the basis for their high metric precision.
Instrument operation and display of measurement results may be via either a separate keypad/display unit or a PC running the software package supplied.

Supplier's Site Datasheet

Technical Specifications

  Piezosystem Jena, Inc.
Product Category Dimensional Gages and Instruments
Product Number LM-Series
Product Name Laser-interferometric Gauging Probe
Gage / Instrument Type Gage Head or Probe
Unlock Full Specs
to access all available technical data

Similar Products

Ultrasonic Thickness Gage - 35RDC - Evident Scientific
Specs
Mounting / Loading Options Handheld or Portable
Attribute Measurement Capability Thickness Gage
Minimum Graduation / Resolution 0.0248 to 0.8976 inch (0.6300 to 22.8 mm)
View Details
Thickness Gauge Head - PMGG123 - ABB Measurement & Analytics
ABB Measurement & Analytics
Specs
Mounting / Loading Options Benchtop or Floor
Measurement Scale / Units Metric
Gage / Instrument Type Gaging System or Station
View Details
External Supermicrometer - SuperMicrometer™ : Model B 250 - Pratt & Whitney Measurement Systems, Inc.
Pratt & Whitney Measurement Systems, Inc.
Specs
Mounting / Loading Options Benchtop or Floor
Measurement Scale / Units English; Metric
Gage / Instrument Type Gaging System or Station; Indicator / Comparator; Micrometer; Length
View Details
Digital Dial Indicator - SZ - Imao-Fixtureworks
Specs
Measurement Scale / Units Metric
Gage / Instrument Type Indicator / Comparator
View Details