Oxford Instruments Silicon Drift Detectors (SDD) Ultim® Max TLE

Ultim Max TLE, our flagship SDD detector for TEM. This detector is optimized to offer elemental characterization at the atomic scale delivering maximum count rates at minimum probe sizes. This performance is achieved using an optimized shape, 100 mm2 sensor, windowless construction, optimized mechanical design and extreme electronics. Solid angle of 0.5 - 1.1 srad Up to 8x increase in sensitivity for low energy X-rays Quantitative analysis at >400,000 cps Collect spectra at specimen temperatures > 1000°C during in situ experiments