Oxford Instruments Silicon Drift Detectors (SDD) Ultim® Max TEM

Ultim Max TEM, our SDD detector for nanoscale analysis and elemental mapping in the TEM. Using a new low-profile 80 mm2 sensor gets closer to the specimen delivering more x-ray counts under any condition. Combined with a windowless construction and extreme electronics this detector delivers high-performance EDS for 200kV TEMs. Solid angle of 0.2 - 0.6 srad Up to 8x increase in sensitivity for low energy X-rays Quantitative analysis at >400,000 cps Collect spectra at specimen temperatures > 1000°C during in situ experiments