The 74AHC273-Q100; 74AHCT273-Q100 is an octal positive-edge triggered D-type flip-flop. The device features clock (CP) and master reset (MR) inputs. The outputs Qn will assume the state of their corresponding D inputs that meet the set-up and hold time requirements on the LOW-to-HIGH clock (CP) transition. A LOW on MR forces the outputs LOW independently of clock and data inputs. Inputs are overvoltage tolerant. This feature allows the use of these devices as translators in mixed voltage environments.
This product has been qualified to the Automotive Electronics Council (AEC) standard Q100 (Grade 1) and is suitable for use in automotive applications.
Features and benefits Automotive product qualification in accordance with AEC-Q100 (Grade 1) Specified from -40 °C to +85 °C and from -40 °C to +125 °C Wide supply voltage range from 2.0 to 5.5 V Overvoltage tolerant inputs to 5.5 V High noise immunity CMOS low power dissipation Balanced propagation delays All inputs have Schmitt-trigger actions Ideal buffer for MOS microcontroller or memory Common clock and master reset
Latch-up performance exceeds 100 mA per JESD 78 Class II Level A Input levels: For 74AHC273-Q100: CMOS level For 74AHCT273-Q100: TTL level ESD protection: MIL-STD-883, method 3015 exceeds 2000 V HBM JESD22-A114F exceeds 2000 V MM JESD22-A115-A exceeds 200 V (C = 200 pf, R = 0 Ω) Multiple package options DHVQFN package with Side-Wettable Flanks enabling Automatic Optical Inspection (AOI) of solder joints
The 74AHC273-Q100; 74AHCT273-Q100 is an octal positive-edge triggered D-type flip-flop. The device features clock (CP) and master reset (MR) inputs. The outputs Qn will assume the state of their corresponding D inputs that meet the set-up and hold time requirements on the LOW-to-HIGH clock (CP) transition. A LOW on MR forces the outputs LOW independently of clock and data inputs. Inputs are overvoltage tolerant. This feature allows the use of these devices as translators in mixed voltage environments.
This product has been qualified to the Automotive Electronics Council (AEC) standard Q100 (Grade 1) and is suitable for use in automotive applications.
Features and benefits
- Automotive product qualification in accordance with AEC-Q100 (Grade 1)
- Specified from -40 °C to +85 °C and from -40 °C to +125 °C
- Wide supply voltage range from 2.0 to 5.5 V
- Overvoltage tolerant inputs to 5.5 V
- High noise immunity
- CMOS low power dissipation
- Balanced propagation delays
- All inputs have Schmitt-trigger actions
- Ideal buffer for MOS microcontroller or memory
- Common clock and master reset
- Latch-up performance exceeds 100 mA per JESD 78 Class II Level A
- Input levels:
- For 74AHC273-Q100: CMOS level
- For 74AHCT273-Q100: TTL level
- ESD protection:
- MIL-STD-883, method 3015 exceeds 2000 V
- HBM JESD22-A114F exceeds 2000 V
- MM JESD22-A115-A exceeds 200 V (C = 200 pf, R = 0 Ω)
- Multiple package options
- DHVQFN package with Side-Wettable Flanks enabling Automatic Optical Inspection (AOI) of solder joints
