Microchip Technology, Inc. Silicon Carbide Test/Evaluation Products MSCDR-EFUSE-005

The E-Fuse demonstrator can detect and interrupt fault currents in microseconds, 100–500 times faster than traditional mechanical approaches because of its high-voltage solid-state design. The fast response time substantially reduces peak short-circuit currents from tens of kilo-amps to hundreds of amps, which can prevent a fault event from resulting in a hard failure. Enabled by silicon carbide technology, the demonstrator board is available in six variants for 400-800V battery systems and with current ratings up to 30 amps.

800V20A SIC E-FUSE DEMONSTRATOR