Micro-Epsilon Group White light interferometer for precise and high speed thickness measurement of thin layers interferoMETER IMS5200MP-TH26

Description
The IMS5200MP-TH white light interferometer is used for fast and reliable thickness measurements of thin transparent layers from 1 µm to 100 µm. The matched system enables multi-peak measurement, so up to 5 thin layers can be detected in one measurement.
Request a Quote Datasheet
Description
The IMS5200MP-TH white light interferometer is used for fast and reliable thickness measurements of thin transparent layers from 1 µm to 100 µm. The matched system enables multi-peak measurement, so up to 5 thin layers can be detected in one measurement.
Request a Quote Datasheet

Suppliers

Company
Product
Description
Supplier Links
White light interferometer for precise and high speed thickness measurement of thin layers - interferoMETER IMS5200MP-TH26 - Micro-Epsilon Group
Ortenburg, Germany
White light interferometer for precise and high speed thickness measurement of thin layers
interferoMETER IMS5200MP-TH26
White light interferometer for precise and high speed thickness measurement of thin layers interferoMETER IMS5200MP-TH26
The IMS5200MP-TH white light interferometer is used for fast and reliable thickness measurements of thin transparent layers from 1 µm to 100 µm. The matched system enables multi-peak measurement, so up to 5 thin layers can be detected in one measurement.

The IMS5200MP-TH white light interferometer is used for fast and reliable thickness measurements of thin transparent layers from 1 µm to 100 µm. The matched system enables multi-peak measurement, so up to 5 thin layers can be detected in one measurement.

Supplier's Site Datasheet

Technical Specifications

  Micro-Epsilon Group
Product Category Interferometers
Product Number interferoMETER IMS5200MP-TH26
Product Name White light interferometer for precise and high speed thickness measurement of thin layers
Measurement Capability Thickness; Specialty / Other; Thin layer thickness
Optical Configuration White LED interferometer
User Interface Analog Control; Digital
Unlock Full Specs
to access all available technical data

Similar Products

Sensors for distance measurements - interferoMETER IMP DS19 - Micro-Epsilon Group
Specs
Measurement Capability Displacement / Position; Specialty / Other; Distance
Optical Configuration NIR-SLED interferometer
Operating Temperature 41 to 158 F (5 to 70 C)
View Details
High precision inline wafer thickness measurement - interferoMETER IMS5420IP67MP-TH - Micro-Epsilon Group
Specs
Measurement Capability Thickness; Specialty / Other; Wafer thickness
Optical Configuration NIR-SLED interferometer
User Interface Digital
View Details
Sensors for thickness measurements - interferoMETER IMP TH45 - Micro-Epsilon Group
Specs
Measurement Capability Thickness; Specialty / Other; Thickness
Optical Configuration NIR-SLED interferometer
Operating Temperature 41 to 158 F (5 to 70 C)
View Details
Sensors for wafer thickness measurements - interferoMETER IMP-NIR-TH24 - Micro-Epsilon Group
Specs
Measurement Capability Thickness; Specialty / Other; Wafer thickness
Optical Configuration NIR-SLED interferometer
Operating Temperature 50 to 122 F (10 to 50 C)
View Details