The innovative IMS5200-TH white light interferometer from Micro-Epsilon opens up new perspectives for fast and reliable thickness measurements of thin layers from 1 µm to 100 µm. The interferometers are used for high-precision thickness measurement of transparent single layers and multilayer coatings. With a measuring rate up to 24 kHz, the IMS5200-TH models are ideally suited for industrial use.
| Micro-Epsilon Group | |
|---|---|
| Product Category | Interferometers |
| Product Number | interferoMETER IMS5200-TH26 |
| Product Name | White light interferometer for precise and high speed thickness measurement of thin layers |
| Measurement Capability | Thickness; Specialty / Other; Thin layer thickness |
| Optical Configuration | White LED interferometer |
| User Interface | Analog Control; Digital |
