Matexcel Microscopy Reference Standard 794 SEM-794

Description
Pitch: <1nm-20nm Surface feature: Gold particles Substrate: Carbon Mounting: JEOL Mounted
  • Microscopy Reference Standard 794 - SEM-794 - Matexcel
    Matexcel
Datasheet
Description
Pitch: <1nm-20nm Surface feature: Gold particles Substrate: Carbon Mounting: JEOL Mounted
Datasheet

Suppliers

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Product
Description
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Microscopy Reference Standard 794 - SEM-794 - Matexcel
Matexcel
Shirley, NY, United States
Microscopy Reference Standard 794
SEM-794
Microscopy Reference Standard 794 SEM-794
Pitch: <1nm-20nm Surface feature: Gold particles Substrate: Carbon Mounting: JEOL Mounted

Pitch: <1nm-20nm
Surface feature: Gold particles
Substrate: Carbon
Mounting: JEOL Mounted

Supplier's Site Datasheet

Technical Specifications

  Matexcel
Product Category Microscopy and Metallography Sample Preparation Equipment
Product Number SEM-794
Product Name Microscopy Reference Standard 794
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