The high-strength SiN film enables us to observe a serially large area of a millimeter in size. It is also ideal for observation of serially sliced sections because there is no invisible area that is caused by conventional TEM grids. The dedicated retainer makes it easy to perform Correlative Light and Electron Microscopy (CLEM).
| JEOL USA, Inc. | |
|---|---|
| Product Category | Microscopy and Metallography Sample Preparation Equipment |
| Product Name | SiN Window Chip |
