Matexcel Microscopy Reference Standard 829 ASS-829

Description
Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon Mounting: Mounted on Universal 1\" (25.4 mm) round x 20 mm high
  • Microscopy Reference Standard 829 - ASS-829 - Matexcel
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Datasheet
Description
Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon Mounting: Mounted on Universal 1\" (25.4 mm) round x 20 mm high
Datasheet

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Microscopy Reference Standard 829 - ASS-829 - Matexcel
Matexcel
Shirley, NY, United States
Microscopy Reference Standard 829
ASS-829
Microscopy Reference Standard 829 ASS-829
Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon Mounting: Mounted on Universal 1\" (25.4 mm) round x 20 mm high

Pitch: 70 nm
Surface feature: Silicon Oxide ridges
Substrate: Silicon
Mounting: Mounted on Universal 1\" (25.4 mm) round x 20 mm high

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Technical Specifications

  Matexcel
Product Category Microscopy and Metallography Sample Preparation Equipment
Product Number ASS-829
Product Name Microscopy Reference Standard 829
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