Matexcel Microscopy Reference Standard 827 ASS-827

Description
Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon Mounting: Mounted mounted FEI/Leica/LEO/Cambri dge/Philips Pin-Type Mount 12.7(table)X3.2(pin) X 8.0mm(length)
  • Microscopy Reference Standard 827 - ASS-827 - Matexcel
    Matexcel
Datasheet
Description
Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon Mounting: Mounted mounted FEI/Leica/LEO/Cambri dge/Philips Pin-Type Mount 12.7(table)X3.2(pin) X 8.0mm(length)
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Microscopy Reference Standard 827 - ASS-827 - Matexcel
Matexcel
Shirley, NY, United States
Microscopy Reference Standard 827
ASS-827
Microscopy Reference Standard 827 ASS-827
Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon Mounting: Mounted mounted FEI/Leica/LEO/Cambri dge/Philips Pin-Type Mount 12.7(table)X3.2(pin) X 8.0mm(length)

Pitch: 70 nm
Surface feature: Silicon Oxide ridges
Substrate: Silicon
Mounting: Mounted mounted FEI/Leica/LEO/Cambridge/Philips Pin-Type Mount 12.7(table)X3.2(pin)X 8.0mm(length)

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Technical Specifications

  Matexcel
Product Category Microscopy and Metallography Sample Preparation Equipment
Product Number ASS-827
Product Name Microscopy Reference Standard 827
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