Matexcel Microscopy Reference Standard 824 ASS-824

Description
Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon (4x3 mm die. Ridge height (about 35 nm) and width (about 35 nm) are not calibrated. ) Mounting: Unmounted
Datasheet
Description
Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon (4x3 mm die. Ridge height (about 35 nm) and width (about 35 nm) are not calibrated. ) Mounting: Unmounted
Datasheet

Suppliers

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Description
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Microscopy Reference Standard 824 - ASS-824 - Matexcel
Shirley, NY, United States
Microscopy Reference Standard 824
ASS-824
Microscopy Reference Standard 824 ASS-824
Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon (4x3 mm die. Ridge height (about 35 nm) and width (about 35 nm) are not calibrated. ) Mounting: Unmounted

Pitch: 70 nm
Surface feature: Silicon Oxide ridges
Substrate: Silicon (4x3 mm die. Ridge height (about 35 nm) and width (about 35 nm) are not calibrated. )
Mounting: Unmounted

Supplier's Site Datasheet

Technical Specifications

  Matexcel
Product Category Microscopy and Metallography Sample Preparation Equipment
Product Number ASS-824
Product Name Microscopy Reference Standard 824
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