With optical comparators and measuring microscopes, an operator moves the XY stage, obtains the coordinates of the measurement point, and measures dimensions based on the travel range. Since the stage needs to be moved for each measurement point, measuring can become a long and tedious process.
The IM Series Instant Measurement System extracts measurement points with a large diameter lens and a specially designed CMOS camera. It can measure up to 99 points simultaneously and significantly reduce measurement time.
Unlike optical comparators and measuring microscopes, the IM Series uses pattern matching. As a result, the measurements do not depend on human vision and the result is consistent regardless of the operator.
WIDE- FIELD + ADJUSTABLE ILLUMINATION MODEL [IM-6225]
Wide-field and adjustable illumination model of the image dimension measurement system that enables illuminated place-and-press measurement
This model is equipped with an adjustable illumination unit that integrates multiple ring illumination functions into a single unit. The optimal illumination conditions can be reproduced, which enables even and stable illuminated measurement.
KEYENCE | |
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Product Category | Dimensional and Profile Scanners |
Product Number | IM-6225 |
Product Name | Image Dimension Measuring System, Wide-field + Adjustable Illumination Model |
Machine Type | 2-D Scanning / Profiling |