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KEYENCE Image Dimension Measuring System, Wide-field + Adjustable Illumination Model IM-6225

Description
With optical comparators and measuring microscopes, an operator moves the XY stage, obtains the coordinates of the measurement point, and measures dimensions based on the travel range. Since the stage needs to be moved for each measurement point, measuring can become a long and tedious process. The IM Series Instant Measurement System extracts measurement points with a large diameter lens and a specially designed CMOS camera. It can measure up to 99 points simultaneously and significantly reduce measurement time. Unlike optical comparators and measuring microscopes, the IM Series uses pattern matching. As a result, the measurements do not depend on human vision and the result is consistent regardless of the operator. WIDE- FIELD + ADJUSTABLE ILLUMINATION MODEL [IM-6225] Wide-field and adjustable illumination model of the image dimension measurement system that enables illuminated place-and-press measurement This model is equipped with an adjustable illumination unit that integrates multiple ring illumination functions into a single unit. The optimal illumination conditions can be reproduced, which enables even and stable illuminated measurement.

Suppliers

Company
Product
Description
Supplier Links
Image Dimension Measuring System, Wide-field + Adjustable Illumination Model - IM-6225 - KEYENCE
Elmwood Park, NJ, USA
Image Dimension Measuring System, Wide-field + Adjustable Illumination Model
IM-6225
Image Dimension Measuring System, Wide-field + Adjustable Illumination Model IM-6225
With optical comparators and measuring microscopes, an operator moves the XY stage, obtains the coordinates of the measurement point, and measures dimensions based on the travel range. Since the stage needs to be moved for each measurement point, measuring can become a long and tedious process. The IM Series Instant Measurement System extracts measurement points with a large diameter lens and a specially designed CMOS camera. It can measure up to 99 points simultaneously and significantly reduce measurement time. Unlike optical comparators and measuring microscopes, the IM Series uses pattern matching. As a result, the measurements do not depend on human vision and the result is consistent regardless of the operator. WIDE- FIELD + ADJUSTABLE ILLUMINATION MODEL [IM-6225] Wide-field and adjustable illumination model of the image dimension measurement system that enables illuminated place-and-press measurement This model is equipped with an adjustable illumination unit that integrates multiple ring illumination functions into a single unit. The optimal illumination conditions can be reproduced, which enables even and stable illuminated measurement.

With optical comparators and measuring microscopes, an operator moves the XY stage, obtains the coordinates of the measurement point, and measures dimensions based on the travel range. Since the stage needs to be moved for each measurement point, measuring can become a long and tedious process.

The IM Series Instant Measurement System extracts measurement points with a large diameter lens and a specially designed CMOS camera. It can measure up to 99 points simultaneously and significantly reduce measurement time.

Unlike optical comparators and measuring microscopes, the IM Series uses pattern matching. As a result, the measurements do not depend on human vision and the result is consistent regardless of the operator.

WIDE- FIELD + ADJUSTABLE ILLUMINATION MODEL [IM-6225]

Wide-field and adjustable illumination model of the image dimension measurement system that enables illuminated place-and-press measurement

This model is equipped with an adjustable illumination unit that integrates multiple ring illumination functions into a single unit. The optimal illumination conditions can be reproduced, which enables even and stable illuminated measurement.

Supplier's Site

Technical Specifications

  KEYENCE
Product Category Dimensional and Profile Scanners
Product Number IM-6225
Product Name Image Dimension Measuring System, Wide-field + Adjustable Illumination Model
Machine Type 2-D Scanning / Profiling
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