Boundary-scan test and programming applications are only as dependable as the hardware they run on. JTAG Technologies has the industry's most reliable IEEE 1149.x controllers, specifically designed by us for high throughput and the best signal integrity. High-speed DataBlaster controllers are available in all of the popular formats (PCI, PCIe, PXI, USB, Ethernet, Firewire) and are performance-scalable
. If economy is a priority, the Explorer controller with a USB interface is the ideal choice. Auxiliary digital I/O scan (DIOS) modules, socket test modules (STM) and independant MIOS products add scan test and analog measurement coverage into portions of your design that lack access - giving you a convenient way to test sockets, connectors and sensors.
Boundary-scan test and programming applications are only as dependable as the hardware they run on. JTAG Technologies has the industry's most reliable IEEE 1149.x controllers, specifically designed by us for high throughput and the best signal integrity. High-speed DataBlaster controllers are available in all of the popular formats (PCI, PCIe, PXI, USB, Ethernet, Firewire) and are performance-scalable. If economy is a priority, the Explorer controller with a USB interface is the ideal choice. Auxiliary digital I/O scan (DIOS) modules, socket test modules (STM) and independant MIOS products add scan test and analog measurement coverage into portions of your design that lack access - giving you a convenient way to test sockets, connectors and sensors.
