Rad hard high and low side gate driver - MIL-PRF-38534 Level S Screening
RIC7S113 is a rad hard high voltage, high speed power MOSFET and IGBT driver with independent high and low side referenced output channels. It is intended for harsh radiation environments such as space, with electrical parameters specified pre and post-irradiation up to 100 krad(Si) and single effect effects (SEE) characterized up to a linear energy transfer (LET) of 81.9 MeV·cm2/mg.
Summary of features
Independent high and low side gate driver
Independent bias supply for logic and power with ±5V offset
Wide bias supply voltage range
Undervoltage lockout for both channels
CMOS Schmitt trigger inputs with internal pull-down resistor
Integrated level shift for high side drive
Cycle by cycle edge triggered shutdown logic pin
Matched propagation delay for both channels
Hermetically sealed package
Lightweight
Total ionizing dose (TID) hardness
High dose rate (50-300 rad(Si)/s) of 100 krad(Si)
Single event effect (SEE) hardness
Safe operating area (SOA) defined for no SEB, SEGR up to LET of 81.9 MeV·cm2/mg
SET characterized up to LET of 81.9 MeV·cm2/mg
Benefits
Reduce size and weight by eliminating bulky gate drive transformers
Increase reliability over opto-coupler based gate driver designs
50 V/ns transient immunity for robust high-speed switching
Potential applications
Satellite bus and payload
Power conditioning unitP
Power distribution unit
DC-DC converter
Motor drive
Similar Parts
RIC7S113A4SCB
883 Level B Screening
RIC7S113A4SCS
883 Level S Screening
RIC7S113L4
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RIC7S113E4
COTS
RIC7S113C4CDV
COTS
RIC7S113A4
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RIC7S113C4CDH
MIL-PRF-38535 Level B Screening
RIC7S113C4CDK
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RIC7S113L4SCB
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RIC7S113L4SCB
MIL-PRF-38535 Level B Screening
RIC7S113L4SCS
MIL-PRF-38535 Level S Screening
RIC7S113E4SCS
MIL-PRF-38535 Level S Screening
Rad hard high and low side gate driver - MIL-PRF-38534 Level S Screening
RIC7S113 is a rad hard high voltage, high speed power MOSFET and IGBT driver with independent high and low side referenced output channels. It is intended for harsh radiation environments such as space, with electrical parameters specified pre and post-irradiation up to 100 krad(Si) and single effect effects (SEE) characterized up to a linear energy transfer (LET) of 81.9 MeV·cm2/mg.
Summary of features
- Independent high and low side gate driver
- Independent bias supply for logic and power with ±5V offset
- Wide bias supply voltage range
- Undervoltage lockout for both channels
- CMOS Schmitt trigger inputs with internal pull-down resistor
- Integrated level shift for high side drive
- Cycle by cycle edge triggered shutdown logic pin
- Matched propagation delay for both channels
- Hermetically sealed package
- Lightweight
- Total ionizing dose (TID) hardness
- High dose rate (50-300 rad(Si)/s) of 100 krad(Si)
- Single event effect (SEE) hardness
- Safe operating area (SOA) defined for no SEB, SEGR up to LET of 81.9 MeV·cm2/mg
- SET characterized up to LET of 81.9 MeV·cm2/mg
Benefits
- Reduce size and weight by eliminating bulky gate drive transformers
- Increase reliability over opto-coupler based gate driver designs
- 50 V/ns transient immunity for robust high-speed switching
Potential applications
- Satellite bus and payload
- Power conditioning unitP
- Power distribution unit
- DC-DC converter
- Motor drive
Similar Parts
RIC7S113A4SCB
883 Level B Screening
RIC7S113A4SCS
883 Level S Screening
RIC7S113L4
COTS
RIC7S113E4
COTS
RIC7S113C4CDV
COTS
RIC7S113A4
COTS
RIC7S113C4CDH
MIL-PRF-38535 Level B Screening
RIC7S113C4CDK
MIL-PRF-38535 Level S Screening
RIC7S113L4SCB
MIL-PRF-38535 Level B Screening
RIC7S113L4SCB
MIL-PRF-38535 Level B Screening
RIC7S113L4SCS
MIL-PRF-38535 Level S Screening
RIC7S113E4SCS
MIL-PRF-38535 Level S Screening