Infineon Technologies AG High Reliability - Space - Power - Rad hard power ICs - RIC7S113C4CDK RIC7S113C4CDK

Description
Rad hard high and low side gate driver - MIL-PRF-38534 Level S Screening RIC7S113 is a rad hard high voltage, high speed power MOSFET and IGBT driver with independent high and low side referenced output channels. It is intended for harsh radiation environments such as space, with electrical parameters specified pre and post-irradiation up to 100 krad(Si) and single effect effects (SEE) characterized up to a linear energy transfer (LET) of 81.9 MeV·cm2/mg. Summary of features Independent high and low side gate driver Independent bias supply for logic and power with ±5V offset Wide bias supply voltage range Undervoltage lockout for both channels CMOS Schmitt trigger inputs with internal pull-down resistor Integrated level shift for high side drive Cycle by cycle edge triggered shutdown logic pin Matched propagation delay for both channels Hermetically sealed package Lightweight Total ionizing dose (TID) hardness High dose rate (50-300 rad(Si)/s) of 100 krad(Si) Single event effect (SEE) hardness Safe operating area (SOA) defined for no SEB, SEGR up to LET of 81.9 MeV·cm2/mg SET characterized up to LET of 81.9 MeV·cm2/mg Benefits Reduce size and weight by eliminating bulky gate drive transformers Increase reliability over opto-coupler based gate driver designs 50 V/ns transient immunity for robust high-speed switching Potential applications Satellite bus and payload Power conditioning unitP Power distribution unit DC-DC converter Motor drive Similar Parts RIC7S113A4SCB 883 Level B Screening RIC7S113A4SCS 883 Level S Screening RIC7S113L4 COTS RIC7S113E4 COTS RIC7S113C4CDV COTS RIC7S113A4 COTS RIC7S113C4CDH MIL-PRF-38535 Level B Screening RIC7S113C4CDK MIL-PRF-38535 Level S Screening RIC7S113L4SCB MIL-PRF-38535 Level B Screening RIC7S113L4SCB MIL-PRF-38535 Level B Screening RIC7S113L4SCS MIL-PRF-38535 Level S Screening RIC7S113E4SCS MIL-PRF-38535 Level S Screening
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Description
Rad hard high and low side gate driver - MIL-PRF-38534 Level S Screening RIC7S113 is a rad hard high voltage, high speed power MOSFET and IGBT driver with independent high and low side referenced output channels. It is intended for harsh radiation environments such as space, with electrical parameters specified pre and post-irradiation up to 100 krad(Si) and single effect effects (SEE) characterized up to a linear energy transfer (LET) of 81.9 MeV·cm2/mg. Summary of features Independent high and low side gate driver Independent bias supply for logic and power with ±5V offset Wide bias supply voltage range Undervoltage lockout for both channels CMOS Schmitt trigger inputs with internal pull-down resistor Integrated level shift for high side drive Cycle by cycle edge triggered shutdown logic pin Matched propagation delay for both channels Hermetically sealed package Lightweight Total ionizing dose (TID) hardness High dose rate (50-300 rad(Si)/s) of 100 krad(Si) Single event effect (SEE) hardness Safe operating area (SOA) defined for no SEB, SEGR up to LET of 81.9 MeV·cm2/mg SET characterized up to LET of 81.9 MeV·cm2/mg Benefits Reduce size and weight by eliminating bulky gate drive transformers Increase reliability over opto-coupler based gate driver designs 50 V/ns transient immunity for robust high-speed switching Potential applications Satellite bus and payload Power conditioning unitP Power distribution unit DC-DC converter Motor drive Similar Parts RIC7S113A4SCB 883 Level B Screening RIC7S113A4SCS 883 Level S Screening RIC7S113L4 COTS RIC7S113E4 COTS RIC7S113C4CDV COTS RIC7S113A4 COTS RIC7S113C4CDH MIL-PRF-38535 Level B Screening RIC7S113C4CDK MIL-PRF-38535 Level S Screening RIC7S113L4SCB MIL-PRF-38535 Level B Screening RIC7S113L4SCB MIL-PRF-38535 Level B Screening RIC7S113L4SCS MIL-PRF-38535 Level S Screening RIC7S113E4SCS MIL-PRF-38535 Level S Screening
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Datasheet
Datasheet Summary
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RIC7S113C4CDK is a radiation-hardened high and low side gate driver with independent output channels, designed for space and harsh radiation environments. It supports up to 400 V offset voltage and operates with a supply voltage range of 5 V to 20 V for the logic supply and 10 V to 20 V for the power supply. The device features a 2 A source / -2 A sink drive current, matched propagation delays of 120 ns turn-on and 100 ns turn-off, and CMOS Schmitt trigger inputs with internal pull-down resistors. It includes undervoltage lockout, integrated level shifting, and cycle-by-cycle shutdown logic. The part is rated for a total ionizing dose of 100 krad(Si) and is characterized against single event effects up to an LET of 81.9 MeV⋅cm²/mg. It is supplied in a die format with Class K2 radiation hardness qualification and operates from -55°C to 125°C.

Datasheet Summary
Powered by GS/AI

RIC7S113C4CDK is a radiation-hardened high and low side gate driver with independent output channels, designed for space and harsh radiation environments. It supports up to 400 V offset voltage and operates with a supply voltage range of 5 V to 20 V for the logic supply and 10 V to 20 V for the power supply. The device features a 2 A source / -2 A sink drive current, matched propagation delays of 120 ns turn-on and 100 ns turn-off, and CMOS Schmitt trigger inputs with internal pull-down resistors. It includes undervoltage lockout, integrated level shifting, and cycle-by-cycle shutdown logic. The part is rated for a total ionizing dose of 100 krad(Si) and is characterized against single event effects up to an LET of 81.9 MeV⋅cm²/mg. It is supplied in a die format with Class K2 radiation hardness qualification and operates from -55°C to 125°C.

Suppliers

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Product
Description
Supplier Links
High Reliability - Space - Power - Rad hard power ICs - RIC7S113C4CDK - RIC7S113C4CDK - Infineon Technologies AG
Neubiberg, Germany
High Reliability - Space - Power - Rad hard power ICs - RIC7S113C4CDK
RIC7S113C4CDK
High Reliability - Space - Power - Rad hard power ICs - RIC7S113C4CDK RIC7S113C4CDK
Rad hard high and low side gate driver - MIL-PRF-38534 Level S Screening RIC7S113 is a rad hard high voltage, high speed power MOSFET and IGBT driver with independent high and low side referenced output channels. It is intended for harsh radiation environments such as space, with electrical parameters specified pre and post-irradiation up to 100 krad(Si) and single effect effects (SEE) characterized up to a linear energy transfer (LET) of 81.9 MeV·cm2/mg. Summary of features Independent high and low side gate driver Independent bias supply for logic and power with ±5V offset Wide bias supply voltage range Undervoltage lockout for both channels CMOS Schmitt trigger inputs with internal pull-down resistor Integrated level shift for high side drive Cycle by cycle edge triggered shutdown logic pin Matched propagation delay for both channels Hermetically sealed package Lightweight Total ionizing dose (TID) hardness High dose rate (50-300 rad(Si)/s) of 100 krad(Si) Single event effect (SEE) hardness Safe operating area (SOA) defined for no SEB, SEGR up to LET of 81.9 MeV·cm2/mg SET characterized up to LET of 81.9 MeV·cm2/mg Benefits Reduce size and weight by eliminating bulky gate drive transformers Increase reliability over opto-coupler based gate driver designs 50 V/ns transient immunity for robust high-speed switching Potential applications Satellite bus and payload Power conditioning unitP Power distribution unit DC-DC converter Motor drive Similar Parts RIC7S113A4SCB 883 Level B Screening RIC7S113A4SCS 883 Level S Screening RIC7S113L4 COTS RIC7S113E4 COTS RIC7S113C4CDV COTS RIC7S113A4 COTS RIC7S113C4CDH MIL-PRF-38535 Level B Screening RIC7S113C4CDK MIL-PRF-38535 Level S Screening RIC7S113L4SCB MIL-PRF-38535 Level B Screening RIC7S113L4SCB MIL-PRF-38535 Level B Screening RIC7S113L4SCS MIL-PRF-38535 Level S Screening RIC7S113E4SCS MIL-PRF-38535 Level S Screening

Rad hard high and low side gate driver - MIL-PRF-38534 Level S Screening

RIC7S113 is a rad hard high voltage, high speed power MOSFET and IGBT driver with independent high and low side referenced output channels. It is intended for harsh radiation environments such as space, with electrical parameters specified pre and post-irradiation up to 100 krad(Si) and single effect effects (SEE) characterized up to a linear energy transfer (LET) of 81.9 MeV·cm2/mg.

Summary of features

  • Independent high and low side gate driver
  • Independent bias supply for logic and power with ±5V offset
  • Wide bias supply voltage range
  • Undervoltage lockout for both channels
  • CMOS Schmitt trigger inputs with internal pull-down resistor
  • Integrated level shift for high side drive
  • Cycle by cycle edge triggered shutdown logic pin
  • Matched propagation delay for both channels
  • Hermetically sealed package
  • Lightweight
  • Total ionizing dose (TID) hardness
  • High dose rate (50-300 rad(Si)/s) of 100 krad(Si)
  • Single event effect (SEE) hardness
  • Safe operating area (SOA) defined for no SEB, SEGR up to LET of 81.9 MeV·cm2/mg
  • SET characterized up to LET of 81.9 MeV·cm2/mg

Benefits

  • Reduce size and weight by eliminating bulky gate drive transformers
  • Increase reliability over opto-coupler based gate driver designs
  • 50 V/ns transient immunity for robust high-speed switching

Potential applications

  • Satellite bus and payload
  • Power conditioning unitP
  • Power distribution unit
  • DC-DC converter
  • Motor drive

Similar Parts

RIC7S113A4SCB

883 Level B Screening

RIC7S113A4SCS

883 Level S Screening

RIC7S113L4

COTS

RIC7S113E4

COTS

RIC7S113C4CDV

COTS

RIC7S113A4

COTS

RIC7S113C4CDH

MIL-PRF-38535 Level B Screening

RIC7S113C4CDK

MIL-PRF-38535 Level S Screening

RIC7S113L4SCB

MIL-PRF-38535 Level B Screening

RIC7S113L4SCB

MIL-PRF-38535 Level B Screening

RIC7S113L4SCS

MIL-PRF-38535 Level S Screening

RIC7S113E4SCS

MIL-PRF-38535 Level S Screening

Supplier's Site Datasheet

Technical Specifications

  Infineon Technologies AG
Product Category Transistors
Product Number RIC7S113C4CDK
Product Name High Reliability - Space - Power - Rad hard power ICs - RIC7S113C4CDK
Package Type Die in waffle pack
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