FT9400 series is a high performance thickness gauge that features a 75 W high powered X-ray tube and a dual detector (semiconductor detector and proportional counter) and responds to all coating thickness measurement needs, including thin film, alloy film and submicroscopic measurements. Can be also used for qualitative analysis of extraneous substances and elemental analysis, as well as coating thickness measurement.
Employs both a semiconductor detector (no LN2 required) that has superior X-ray energy resolution and a proportional counter that has a superior coefficient rate. The semiconductor detector is especially able to distinguish between elements that have contiguous energies such as Ni and Cu, and has the following merits.
Ni/Cu and Au/Ni/Cu measured without a secondary filter.
In the case of a print board that contain Br, capable of high precision Au coating thickness measurements without interference from Br.
Capable of measuring ultra-thin Au films less than 0.01 µm.
FT9400 series is a high performance thickness gauge that features a 75 W high powered X-ray tube and a dual detector (semiconductor detector and proportional counter) and responds to all coating thickness measurement needs, including thin film, alloy film and submicroscopic measurements. Can be also used for qualitative analysis of extraneous substances and elemental analysis, as well as coating thickness measurement.
Employs both a semiconductor detector (no LN2 required) that has superior X-ray energy resolution and a proportional counter that has a superior coefficient rate. The semiconductor detector is especially able to distinguish between elements that have contiguous energies such as Ni and Cu, and has the following merits.
- Ni/Cu and Au/Ni/Cu measured without a secondary filter.
- In the case of a print board that contain Br, capable of high precision Au coating thickness measurements without interference from Br.
- Capable of measuring ultra-thin Au films less than 0.01 µm.
