Hiden Analytical Advanced Langmuir Probe ESPion

Description
The ESPion advanced Langmuir probe for rapid, reliable and accurate plasma diagnostics for industry and academia.
  • Advanced Langmuir Probe - ESPion - Hiden Analytical
    Hiden Analytical
Description
The ESPion advanced Langmuir probe for rapid, reliable and accurate plasma diagnostics for industry and academia.

Suppliers

Company
Product
Description
Supplier Links
Advanced Langmuir Probe - ESPion - Hiden Analytical
Hiden Analytical
Livonia, MI, USA
Advanced Langmuir Probe
ESPion
Advanced Langmuir Probe ESPion
The ESPion advanced Langmuir probe for rapid, reliable and accurate plasma diagnostics for industry and academia.

The ESPion advanced Langmuir probe for rapid, reliable and accurate plasma diagnostics for industry and academia.

Supplier's Site

Technical Specifications

  Hiden Analytical
Product Category Wafer and Thin Film Instrumentation
Product Number ESPion
Product Name Advanced Langmuir Probe
Form Factor Controller; ProbingSystem
Unlock Full Specs
to access all available technical data

Similar Products

Wafer UHV Pro - m2-wafer-uhv-pro - Cosmic Equipment SpA
Cosmic Equipment SpA
Wafer UHV Pro
m2-wafer-uhv-pro
Specs
Form Factor Monitor or instrument
Applications Wafer
View Details
Visual Inspection Machine - - Daitron Co., Ltd.
Daitron Co., Ltd.
Visual Inspection Machine
Specs
Form Factor Monitor or instrument
Mounting / Loading Floor
Technology Optical / Imaging
View Details
EC-52000IC ION CLEANER - - JEOL USA, Inc.
JEOL USA, Inc.
EC-52000IC ION CLEANER
Specs
Form Factor Monitor or instrument
Mounting / Loading Floor
View Details
Metrology Solutions for Semiconductors - - Bruker Corporation
Bruker Corporation
Metrology Solutions for Semiconductors
Specs
Technology Profilometer or AFM (optional feature); X-ray Diffractometer (optional feature)
Applications Wafer; C-S Thin Film Materials
Measurements Defects, dimples or film residues (optional feature); Roughness / Waviness (optional feature)
View Details