Filmetrics, Inc. Automated Cassette-to-Cassette Thin Film Thickness Mapping System F60-c Series

Description
Automated Cassette-to-Cassette Thin-Film Thickness Mapping System for Production Environments The Filmetrics F60-c family maps film thickness and index just like our F50 products, but it also includes a number of features intended specifically for production environments. These include automatic notch finding, automatic on-board baselining, an enclosed measurement stage with motion interlock, an industrial computer with pre-installed software, and cassette-to-cassette robotic wafer handling. The different F60-c instruments are distinguished primarily by thickness and wavelength range. Generally shorter wavelengths (e.g. F60-c-UV) are required to measure thinner films, while longer wavelengths allow measurement of thicker, rougher, and more opaque films. What's Included Integrated Stage/Spectrometer/L ight Source Unit (chuck not included) 4", 6" and 200mm Reference Wafers TS-SiO2-4-7200 Thickness standard Vacuum Pump Spare TH-1 lamp Tweezers
Description
Automated Cassette-to-Cassette Thin-Film Thickness Mapping System for Production Environments The Filmetrics F60-c family maps film thickness and index just like our F50 products, but it also includes a number of features intended specifically for production environments. These include automatic notch finding, automatic on-board baselining, an enclosed measurement stage with motion interlock, an industrial computer with pre-installed software, and cassette-to-cassette robotic wafer handling. The different F60-c instruments are distinguished primarily by thickness and wavelength range. Generally shorter wavelengths (e.g. F60-c-UV) are required to measure thinner films, while longer wavelengths allow measurement of thicker, rougher, and more opaque films. What's Included Integrated Stage/Spectrometer/L ight Source Unit (chuck not included) 4", 6" and 200mm Reference Wafers TS-SiO2-4-7200 Thickness standard Vacuum Pump Spare TH-1 lamp Tweezers

Suppliers

Company
Product
Description
Supplier Links
Automated Cassette-to-Cassette Thin Film Thickness Mapping System - F60-c Series - Filmetrics, Inc.
San Diego, CA, USA
Automated Cassette-to-Cassette Thin Film Thickness Mapping System
F60-c Series
Automated Cassette-to-Cassette Thin Film Thickness Mapping System F60-c Series
Automated Cassette-to-Cassette Thin-Film Thickness Mapping System for Production Environments The Filmetrics F60-c family maps film thickness and index just like our F50 products, but it also includes a number of features intended specifically for production environments. These include automatic notch finding, automatic on-board baselining, an enclosed measurement stage with motion interlock, an industrial computer with pre-installed software, and cassette-to-cassette robotic wafer handling. The different F60-c instruments are distinguished primarily by thickness and wavelength range. Generally shorter wavelengths (e.g. F60-c-UV) are required to measure thinner films, while longer wavelengths allow measurement of thicker, rougher, and more opaque films. What's Included Integrated Stage/Spectrometer/L ight Source Unit (chuck not included) 4", 6" and 200mm Reference Wafers TS-SiO2-4-7200 Thickness standard Vacuum Pump Spare TH-1 lamp Tweezers

Automated Cassette-to-Cassette Thin-Film Thickness Mapping System for Production Environments

The Filmetrics F60-c family maps film thickness and index just like our F50 products, but it also includes a number of features intended specifically for production environments. These include automatic notch finding, automatic on-board baselining, an enclosed measurement stage with motion interlock, an industrial computer with pre-installed software, and cassette-to-cassette robotic wafer handling.

The different F60-c instruments are distinguished primarily by thickness and wavelength range. Generally shorter wavelengths (e.g. F60-c-UV) are required to measure thinner films, while longer wavelengths allow measurement of thicker, rougher, and more opaque films.

What's Included

  • Integrated Stage/Spectrometer/Light Source Unit (chuck not included)
  • 4", 6" and 200mm Reference Wafers
  • TS-SiO2-4-7200 Thickness standard
  • Vacuum Pump
  • Spare TH-1 lamp
  • Tweezers
Supplier's Site

Technical Specifications

  Filmetrics, Inc.
Product Category Wafer and Thin Film Instrumentation
Product Number F60-c Series
Product Name Automated Cassette-to-Cassette Thin Film Thickness Mapping System
Form Factor Monitor or instrument
Mounting / Loading In-process, in-situ or system mounted
Technology Spectrometer (SIMS, XRF, FTIR, DLTS, AAS); Spectral Reflectance
Unlock Full Specs
to access all available technical data

Similar Products

DART™ (Direct Analysis in Real Time) -  - JEOL USA, Inc.
Specs
Form Factor Monitor or instrument
Mounting / Loading Floor
View Details
Quasar200 - quasar200-and-pulsar600 - Cosmic Equipment SpA
Specs
Form Factor Monitor or instrument
Applications Wafer
View Details
Scribe Machine -  - Daitron Co., Ltd.
Daitron Co., Ltd.
Specs
Form Factor Monitor or instrument
Mounting / Loading Floor
Applications Wafer
View Details
Packaging Metrology System - APM650™ - Zygo Corporation
Specs
Form Factor Monitor or instrument
Mounting / Loading Manual loading
Technology Interferometer
View Details