The Filmetrics F60-c family maps film thickness and index just like our F50 products, but it also includes a number of features intended specifically for production environments. These include automatic notch finding, automatic on-board baselining, an enclosed measurement stage with motion interlock, an industrial computer with pre-installed software, and cassette-to-cassette
The different F60-c instruments are distinguished primarily by thickness and wavelength range. Generally shorter wavelengths (e.g. F60-c-UV) are required to measure thinner films, while longer wavelengths allow measurement of thicker, rougher, and more opaque films.
| Filmetrics, Inc. | |
|---|---|
| Product Category | Wafer and Thin Film Instrumentation |
| Product Number | F60-c Series |
| Product Name | Automated Cassette-to-Cassette Thin Film Thickness Mapping System |
| Form Factor | Monitor or instrument |
| Mounting / Loading | In-process, in-situ or system mounted |
| Technology | Spectrometer (SIMS, XRF, FTIR, DLTS, AAS); Spectral Reflectance |