Filmetrics, Inc. Microscopic Spot Measurement Instrument F40-UV Series

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Microscopic Spot Measurement Instrument - F40-UV Series - Filmetrics, Inc.
San Diego, CA, USA
Microscopic Spot Measurement Instrument F40-UV Series
Measure Films as Thin as 4nm The F40-UV can be configured to measure films as thin as 4nm on a spot size as small as 7 microns. It comes complete with its own UV microscope and integrated color video camera that allows exact monitoring of the film thickness measurement spot. Thickness and index can be measured in less than a second. Like all of our tabletop film thickness measurement instruments, the F40-UV connects to the USB port of your Windows™ computer and sets up in minutes. What's Included Integrated Spectrometer/Light Source Unit FILMeasure 7.0 software MA-CMount Microscope adapter with c-mount fitting Fiber optic patch cable BK-7 reference material TS-Focus-SiO2-4-1000 0 Focus/Thickness standard BG-Microscope for taking background baseline FILMeasure standalone software for remote data analysis Tweezers
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Technical Specifications

  Filmetrics, Inc.
Product Category Wafer and Thin Film Instrumentation
Product Number F40-UV Series
Product Name Microscopic Spot Measurement Instrument
Form Factor Monitor or instrument
Applications Wafer; CVD / PVD
Measurements Optical constants (n or k)
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