Filmetrics, Inc. Thin Film Deposition Monitor F30 Series


Supplier Links
Thin Film Deposition Monitor - F30 Series - Filmetrics, Inc.
San Diego, CA, USA
Thin Film Deposition Monitor F30 Series
The Most Powerful Tool Available for Monitoring Thin-Film Deposition Measure deposition rates, film thickness, optical constants (n and k), and uniformity of semiconductors and dielectric layers in real-time with the F30 spectral reflectance system. Example Layers MBE and MOCVD: Smooth and translucent, or lightly absorbing films, may be measured. This includes virtually any semiconducting material, from AIGaN to GaInAsP. Benefits: Dramatically improves productivity Low cost - Can pay for itself in months Accurate - Measure to better than ±1% Fast-Measurements in seconds Non-Invasive - Totally outside of deposition chamber Easy to use - Intuitive Windows™ software Turn-key system sets up in minutes
Supplier's Site

Technical Specifications

  Filmetrics, Inc.
Product Category Wafer and Thin Film Instrumentation
Product Number F30 Series
Product Name Thin Film Deposition Monitor
Form Factor Monitor or instrument
Applications Wafer; CVD / PVD
Measurements Deposition rate; Optical constants (n or k); FilmThickness
Unlock Full Specs
to access all available technical data

Similar Products